Asylum Research launched the Electrochemistry Cell (EC Cell) for its MFP-3D AFMs. The EC Cell is a versatile platform for electrochemical experiments combined with AFM imaging, accommodating metal cylinders, flat conducting samples, and even conducting thin films on insulating substrates.
Computer scientists at the National Institute of Standards and Technology (NIST) have improved software that can take much of the guesswork out of difficult materials development and environmental simulation problems.
CVD Equipment Corporation (NASDAQ: CVV) and Graphene Laboratories Inc. now offer commercial CVDGraphene research starter materials and customization services for transparent and conductive CVD-grown graphene films, transferred onto substrates such as insulating silicon dioxide, plastic, and glass.
GIA released a comprehensive global report on microscopes markets. Scanning-probe and charged particle microscopes were severely hit by the recession, as the microscopes are largely used in semiconductor industry. Going forward, scanning probe microscopes represents the fastest growing product segment in the global microscopes market.
Leica Microsystems and Digital Surf announced an agreement whereby Leica Map surface imaging and metrology software, based on Digital Surf's Mountains Technology, will be used with the Leica Application Suite (LAS) for Leica industrial microscopes.
McPherson’s high-resolution spectrometer, Model 2061, is now available for scanning and imaging applications via 2D CCD or CMOS detectors. It suits emission, luminescence, Raman (strained Silicon), and high-temperature plasma measurement with better than 0.02nm full width half maximum spectra.
LASER COMPONENTS expands its COUNT series of single photon counting modules to include the new COUNTblue devices. These combine low count rates with higher detection efficiencies at shorter wavelengths.
Camera Particle Tracking (CPT) technology is a technique developed at Glasgow University to enhance quantitative measurement capability in research involving optical trapping. Current systems can only measure the force exerted on one particle, but the CPT technology will enable the collection of data from multiple particles at a higher rate.
NIST has found a potentially widely applicable method to expand the capabilities of conventional transmission electron microscopes (TEMs). Passing electrons through a nanometer-scale grating imparts the electron waves with so much orbital momentum that they maintained a corkscrew shape in free space.
inXitu Inc. provides benchtop and portable XRD-based instrumentation used for materials analysis, including a recently introduced variant of its popular benchtop instrument, BTX II. The technology used in its portable rock and mineral analyzer is used with specific application to nanoengineered materials.
The Nanotech Innovations SSP-354 is a low-cost system for producing high-quality, multi-walled carbon nanotubes. The device uses an injection CVD process developed at NASA and is integrated into an instrument small enough to fit in a fume hood. The system can produce research-quality, multi-wall carbon nanotubes within a few hours.
Bruker Corporation (NASDAQ: BRKR) debuted the AcuityXR optical surface profiler mode that combines patent-pending Bruker hardware and software technology to enable select ContourGT non-contact, 3D optical surface profilers to break the optical diffraction limit and deliver better lateral resolutions.
SUSS MicroTec entered into a joint development and exclusive license agreement with Rolith Inc. to develop and build nanostructuring equipment using a nanolithography method developed by Rolith.
Agilent debuted a nanoindentation technique available on the Nano Indenter G200 instrumentation platform. The new technique gives researchers the ability to make accurate, fast substrate-independent measurements on thin film materials by means of nanoindentation. It suits evaluating the elastic modulus of hard samples on soft substrates, or of soft samples on hard substrates.
The FlexTech Alliance has awarded a contract to Cambridge NanoTech to develop a high-speed atomic layer deposition (ALD) system. When completed, the system will enable the manufacture of large-area and flexible substrates for use in organic electronics, solar cells, biomedical devices, and displays.
Metallic and semiconducting single-wall carbon nanotubes (SWCNT) can be distinguished using a new imaging tool for rapidly screening the structures, researched at the Weldon School of Biomedical Engineering, Purdue University.
Asylum Research, scanning probe and atomic force microscopy (SPM/AFM) provider, debuted the NanoRack Sample Stretching Stage Accessory for its MFP-3D AFM systems. The stages offer stress control, force measurements, and strain data recording.
A team of University of Warwick researchers has found molecular hooks on the surface of graphene oxide that will potentially provide massive benefits to researchers using transmission electron microscopes (TEM). They could even be used in building molecular-scale mechanisms.
Scientists involved in the European Union's "Smart inspection systems for high-speed and multifunctional testing of MEMS and MOEMS" (SMARTHIEHS) project are developing a new test concept based on parallel inspection of devices at wafer level.
“If we define a technology as the ability to make something exactly the way we want it, over and over, we do not have this capability at the nanoscale for many structures,” says Thomas Kenny, Professor of Mechanical Engineering at Stanford University.
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