TECHNOLOGY PAPERS

Rapid Defect Indentification with Layout-Aware Diagnosis

Scan logic diagnosis is a powerful tool to help failure analysis engineers determine the root cause of a failing die. Yield engineers, on the other hand, are interested in statistical analysis of volumes of high-quality diagnosis results to determine yield limiters. To be of value for both engineers, a diagnosis tool needs to be Accurate, With high resolution and Meaningful defect classificati...

Flip Chip Devices get Flat and Happy

Thin is definitely in, but what our modern flip chip devices really want is to be flat and happy! As flip chip die have become increasingly thinner in recent years, the ability to control package warpage –i.e. maintain a relative degree of “flatness” -- has become more and more challenging. And, it’s not just the die that are getting thinner: substrates also have much lower profiles than ever b...
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Automated Test Creation for Mixed Signal IP using IJTAG

The creation of test patterns for mixed signal IP has been, to a large extent, a manual effort. To improve the process used to test, access, and control embedded IP, the new IEEE P1687 standard 1 is being defined by a broad coalition of IP vendors, IP users, major ATE companies, and all three major EDA vendors. This new standard, also called IJTAG, is expected to be rapidly and widely adopted b...

Faster Time to Root Cause with Diagnosis-Driven Yield Analysis

This whitepaper describes the benefits of implementing a diagnosis-driven yield analysis flow using the Tessent® Diagnosis and Tessent YieldInsight® software products. ICs developed at advanced technology nodes of 65 nm and below exhibit an increased sensitivity to small manufacturing variations. New design-specific and feature-sensitive failure mechanisms are on the rise. Complex variability i...

NF-Shuttle: Standardizing the fabless MEMS Industry

In order for the MEMS industry to replicate the success of the CMOS fabless model, there is a need for a similar standardized process technology that can be leveraged by a breadth of MEMS developers. This will ultimately lead to the proliferation of disruptive MEMS-based solutions for a plethora of applications including motion sensing, navigation for location-based services, wireless communica...
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A Comparison of High-Purity Fluoropolymer Fitting Technologies

When selecting a fluoropolymer fitting design to be used in ultra high-purity chemical applications, decision makers must consider different performance characteristics. A recent study was conducted that measured key fitting attributes, such as fitting pull-out force, cleanliness and assembly time. The study compared commercially available nonwetted insert, flare, and wetted insert style fittin...


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