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Wafer Test

Wafer Test news and technical articles from Solid State Technology Magazine. Search Wafer Test latest and archived news and articles

  1. FormFactor unveils MEMS-based DRAM wafer testing product

    Online Articles

    Fri, 13 Apr 2007

    probe card, a new product in the company's line of DRAM wafer testing products. The PH150XP probe card promises several yield ..... Harmony XP probe card is designed for full-area 300-mm wafer testing for 1GB and higher-density DRAM devices, the PH150XP is

  2. Elpida Memory, others, agree to form large wafer testing company

    Online Articles

    Wed, 27 Jul 2005

    as reportedly the world's largest wafer testing service. The new company, to be called ..... will order the new company to provide wafer testing for their DRAM products. Tera Probe ..... The company's main business will be wafer testing operations, especially probe process

  1. Flash memory maker orders additional Aehr full-wafer test tool

    Online Articles

    Tue, 5 Jun 2012

    Nasdaq:AEHR ) will install an additional FOX-1 full- wafer test system at a leading flash memory manufacturer. The follow ..... saving benefits” that can be achieved with Aehr full- wafer test , said Carl Buck, VP of marketing at Aehr Test Systems. The

  2. K&S Closes Wafer Test Business Sale

    Online Articles

    Tue, 7 Mar 2006

    Industries Inc. (K&S) has closed the sale of all assets of its wafer test business to SV Probe Pte Ltd., a worldwide probe card and ..... interface manufacturer (please see January 27 th story). The wafer - test assets were reportedly sold for $10.0 million, which includes

  3. Tokyo Electron launches wafer tester for MEMS

    Online Articles

    Thu, 17 Jul 2003

    July 17, 2003 -- Tokyo Electron Ltd. has released a new wafer test system for MEMS devices, according to a news release. The ..... designed for MEMS and other devices for which high-vacuum wafer testing is required. Testing in vacuum conditions is necessary because

  4. Challenges in advanced wafer test probing

    Magazine Articles

    Mon, 1 Sep 2003

    driving up the complexity and the cost of wafer test . Meanwhile, technical requirements ..... 300mm wafer manufacturing is flooding wafer test areas with additional die, driving the ..... article surveys the trends impacting wafer test today and the industry's response to

  5. MicroProbe debuts MEMS-based, multi-DUT, ultra-fine-pitch probe card for IC wafer test

    Online Articles

    Tue, 13 Jul 2010

    (July 13, 2010) -- MicroProbe Inc., supplier of wafer test technology to the global semiconductor industry, released ..... and Vx-RF probe cards.” MicroProbe provides advanced wafer test solutions to global semiconductor manufacturers. For more

  6. Applying Moore's Law to Wafer Test

    Magazine Articles

    Tue, 1 Jun 2004

    Typically, as device complexity increases, wafer test cost increases (Figure 1). This is ..... to the increase in complexity of the wafer test hardware and the probe card. Today ..... Figure 1. Device complexity increases as wafer test costs increase. Click here to enlarge

  7. SV Probe Purchases K&S Wafer Test Business

    Online Articles

    Fri, 27 Jan 2006

    "The combination of SV Probe and K&S wafer test products has moved SV Probe into the global top three, providing a comprehensive set of innovative and cost-effective wafer test solutions," claims Kevin Kurtz, SV Probe's president and

  8. 300-450mm manual wafer test probe configuration out from SemiProbe

    Online Articles

    Wed, 22 Jun 2011

    SemiProbe released a 300mm manual test probe configuration of its Probe System for Life, M-12. The M-12 is field-upgradable to 450mm.

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