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Cascade Microtech introduced the modular MPS150 manual wafer probe station with six application-specific test packages for RF, mmW, and I-V/C-V measurement; failure analysis; and high-power device characterization.
The TrueScale PP40 wafer probe card is designed to enable high-efficiency and high parallelism wafer probing on advanced wire bond logic and SoC devices. By
The Infinity RF wafer probe series works with fine-pitch aluminum pads, creating low and stable contact resistance. Densification and nanodevice trends
The latest addition to its Harmony family of full-area, 300mm wafer probe solutions the Harmony wafer-level burn-in (WLBI) probe card is reportedly designed to maximize throughput, as well as ensure
The Elite 300 300mm wafer probe station for devices with process nodes at 45 nm and below incorporates state-of-the-art electrical and mechanical technology
October 25, 2007 -- FormFactor Inc. has announced a new family of advanced wafer probe cards designed to address the rising cost and technology challenges associated with testing wire bond logic and system-on-chip
that the resulting reduction in a wafer probe 's cross-sectional area lowers ..... 0Amp CCC requirement. Defining a wafer probe 's current carrying capability ..... deflection. Variables affecting wafer - probe CCC Wafer chuck temperature. An
MicroProbe introduced current-carrying capability of >1A/probe in 90µm-pitch full-grid array configurations of its Vx vertical MEMS probe card for wafer-level test.
ERS uncrated the ERS AirCool 3 wafer thermal test system with modular options and easy integration into all major wafer prober systems.
Developed for IC chip manufacturing markets to address probe contamination challenges during test, the SnoScrub wafer-cleaning product uses non-contact CO 2 -composite spray for adjustable (soft-to-hard cryoparticles), microscopic scouring called cryochemical ablation. This technology cleans wafer