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  1. Air-cooled wafer probe chuck debuts in modular format

    Article

    Mon, 17 Oct 2011

    ERS uncrated the ERS AirCool 3 wafer thermal test system with modular options and easy integration into all major wafer prober systems.

  2. MEMS supply chain stronger 1 year after Japanese earthquake

    Article

    Fri, 16 Mar 2012

    Miho; Seiko Epson’s printhead, gyroscope and microphone fab in Sakata; and Micronics Japan Corp.’s MEMS wafer probe operations. Map. Locations of major MEMS and digital compass fabs in Japan. SOURCE: IHS iSuppli March 2012. Knowles

  1. Elpida begins reorganization in Tokyo court: Analysts weigh in

    Article

    Fri, 2 Mar 2012

    Tokyo Stock Exchange in November 2004. It established a joint venture company, Tera Probe, Inc., specialized in wafer probe testing, in 2005. Other businesses of Elpida include Akita Elpida Memory, Inc., a wholly owned subsidiary to take

  2. Keithley Instruments upgrades semiconductor test software suite

    Article

    Thu, 26 Jan 2012

    results within its environment. ACS also simplifies integrating a variety of popular semiautomatic and fully automatic wafer probe stations into a test setup. Keithley Instruments provides advanced electrical test instruments and systems.To learn

  3. TEL power chip dynamicing occurs at the wafer level

    Article

    Tue, 6 Dec 2011

    semiconductor assembly and packaging . TEL developed the dynamicing technique based on Tokyo Electron's experience in wafer probe technology . By detecting defects at the wafer-level, TEL's method ensures that known-good die (KGD) are used

  4. 300-450mm manual wafer test probe configuration out from SemiProbe

    Article

    Wed, 22 Jun 2011

    its Probe System for Life, M-12. The M-12 is field-upgradable to 450mm and to semi-automatic operation. The wafer probe tool includes coarse and fine stage movement, allowing precise alignment with vibration isolation. Precision Z and

  5. FormFactor next-gen DRAM tester contacts 850+ die in parallel

    Article

    Wed, 8 Jun 2011

    effective Known Good Die (KGD) testing for 3D applications. FormFactor Inc. (FORM) has shipped 600 Matrix-family wafer probe cards: TouchMatrix, TrueScale Matrix and SmartMatrix. The company offers wafer sort, burn-in and device performance

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