Wafer Probe
Wafer Probe news and technical articles from Solid State Technology Magazine. Search Wafer Probe latest and archived news and articles
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Cascade Microtech modular wafer probe system offers 6 measurement packages
Cascade Microtech introduced the modular MPS150 manual wafer probe station with six application-specific test packages for RF, mmW, and I-V/C-V measurement; failure analysis; and high-power device characterization.
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Wafer Probe Card
The TrueScale PP40 wafer probe card is designed to enable high-efficiency and high parallelism wafer probing on advanced wire bond logic and SoC devices. By …
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RF Wafer Probe
The Infinity RF wafer probe series works with fine-pitch aluminum pads, creating low and stable contact resistance. Densification and nanodevice trends …
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300mm Wafer Probe Card for Burn-In Test
The latest addition to its Harmony family of full-area, 300mm wafer probe solutions the Harmony wafer-level burn-in (WLBI) probe card is reportedly designed to maximize throughput, as well as ensure …
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300mm Wafer Probe Station
The Elite 300 300mm wafer probe station for devices with process nodes at 45 nm and below incorporates state-of-the-art electrical and mechanical technology …
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FormFactor's new MEMS-based wafer probe cards to speed SoC test
October 25, 2007 -- FormFactor Inc. has announced a new family of advanced wafer probe cards designed to address the rising cost and technology challenges associated with testing wire bond logic and system-on-chip …
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Wafer probe parameters for current carrying capability in semiconductor test Microprobe
… that the resulting reduction in a wafer probe 's cross-sectional area lowers ..... 0Amp CCC requirement. Defining a wafer probe 's current carrying capability ..... deflection. Variables affecting wafer - probe CCC Wafer chuck temperature. An …
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MicroProbe enhances wafer probe card reliability with CCC improvement
MicroProbe introduced current-carrying capability of >1A/probe in 90µm-pitch full-grid array configurations of its Vx vertical MEMS probe card for wafer-level test.
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Air-cooled wafer probe chuck debuts in modular format
ERS uncrated the ERS AirCool 3 wafer thermal test system with modular options and easy integration into all major wafer prober systems.
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Wafer -probe Cleaner
Developed for IC chip manufacturing markets to address probe contamination challenges during test, the SnoScrub wafer-cleaning product uses non-contact CO 2 -composite spray for adjustable (soft-to-hard cryoparticles), microscopic scouring called cryochemical ablation. This technology cleans wafer
