Wafer Inspection
Wafer Inspection news and technical articles from Solid State Technology Magazine. Search Wafer Inspection latest and archived news and articles
-
ICOS acquires 2D wafer inspection business from Siemens AG
… Belgium, has acquired the 2D wafer inspection business of Siemens AG for a cash ..... Siemens' two dimensional (2D) wafer inspection technology, as well as the assets related to the wafer inspection business. The acquisition was …
-
Through-wafer Inspection for MEMS Devices — a Comparison
… these defects. In semiconductor manufacturing, automatic wafer inspection is essential to detect defects in the early stage. At ..... Figure 4.) Figure 4. High precision, fully automatic wafer inspection with handling unit. Click here to enlarge image 1. The …
-
KLA-Tencor debuts LED substrate epi-wafer inspection system
… reliability. KLA-Tencor also debuted the KLARITY LED automated analysis and defect data management system and ICOS WI-2220 wafer inspection tool designed specifically for LED defect inspection. KLA-Tencor Corporation provides process control and yield management …
-
OSAT places $3m order for Camtek wafer inspection systems
… NASDAQ and TASE: CAMT) received an order for multiple wafer inspection systems from a major outsourced semiconductor assembly ..... million dollars, includes several Condor systems for 2D wafer inspection . The systems are expected to be installed during the fourth …
-
New technology combines bright- and dark-field wafer inspection in one tool
… new company has introduced a 65nm wafer inspection tool with new technology that it says ..... combines bright-field and dark-field wafer inspection technologies into one platform. The ..... semiconductor industry. Neumann launched a wafer inspection company, Orbot Instruments, Ltd …
-
KLA-Tencor Wafer Inspection Technology Speeds Ramp of 300 mm Production
… materials has resulted in an increasingly stringent need for wafer inspection tools that have both the resolution to capture these new ..... time possible. According to TI, KLA-Tencor's 2350 wafer inspection tool is meeting these challenges during the ramp of TI …
-
Laser-imaging patterned wafer inspection
Laser-imaging patterned wafer inspection The ILM-2230 laser-imaging darkfield patterned wafer inspection system combines oblique angle darkfield illumination with small-pixel, high data rate image processing. This combination provides …
-
KLA-Tencor acquires Inspex's wafer inspection business
… 27, 2004 - KLA-Tencor announced it has acquired the Wafer Inspection Systems business of Inspex, Inc., a US company owned ..... software, spare parts, and inventory related to Inspex's wafer inspection business, which halted production when the company filed …
-
Automatic wafer inspection system replaces eyeballs with cameras
A fully automated RDS inspection system that replaces human inspectors is a game changer. Christopher Eric Brannon, Texas Instruments, Inc., Dallas, TX
-
AMAT-darkfield-wafer -inspection -finds-40nm-particles-on-patterned-wafers
Applied Materials Inc. (AMAT) debuted the Applied DFinder darkfield inspection system, which uses deep ultraviolet (DUV) laser scanning for particle sensitivity down to 40nm on patterned wafers. The product suits inspecting the interconnect layers in 22nm and below memory and logic chips.
