Wafer Inspection
Wafer Inspection news and technical articles from Solid State Technology Magazine. Search Wafer Inspection latest and archived news and articles
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KLA-Tencor's updated LED wafer inspection tool boosts throughput, efficiency
… says its new fourth-generation LED wafer inspection system achieves greater flexibility ..... company’s Candela LED unpatterned wafer inspection system and Klarity LED automated analysis ..... binning; frontend-of-line patterned wafer inspection for baseline yield improvement, rework …
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NIST funds advanced wafer inspection technology development
… for a project to develop advanced wafer inspection technology for next-generation lithography ..... work to develop an optical patterned wafer inspection tool capable of detecting defects ..... times faster than existing optical wafer inspection tools. ?We are confident that this …
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Wafer Inspection and defect review
Wafer inspection and defect review This system allows an automated approach to patterned wafer inspection for process diagnostics of 300-mm processing tools. Defect review is possible at high magnifications and in various imaging modes, including …
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Electroglas Offer QuickSilver II Bumped Wafer Inspection System
CORVALLIS, OR. May 17, 2000 Electroglas Inspection Products has increased wafer throughput, accuracy, and repeatability of QuickSilver II post-fab bumped wafer inspection system, company officials say. By Lisa Nadile
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Wafer Inspection System — RVSI
The WS-3800 Xpress, RVSI's next-generation model in its WS-Series Wafer Inspection Systems, is said to perform macro-defect inspection on up to 115 wafers-per-hour, offering high throughput while maintaining …
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Automatic Wafer Inspection
… broadened its platform into the semiconductor market with the introduction of the MX20000IR fully automatic wafer inspection system. The application scope of the system includes MEMS, wafer bonds, flip chip and photovoltaics. Wafers …
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U.S. IDM Installs Olympus Wafer Inspection System
… Technologies America (Olympus-ITA), a subsidiary of Olympus Corporation of Japan, completed sale of its Model AL3300 wafer inspection and defect review system to a U.S.-based integrated device manufacturer (IDM). The company will use the AL3300 …
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KLA-Tencor beefs up wafer inspection
… December 17, 2003 - KLA-Tencor, San Jose, CA, has added inline process monitoring capabilities to its Surfscan family of wafer inspection products. The Monitor eXpert software suite enables the tools to perform various measurements online, including haze …
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Applied gets Schlumberger's e-beam wafer inspection business
… Nov. 26, 2001 - Santa Clara, CA - Applied Materials has acquired the assets of Schlumberger's electron-beam wafer inspection business for an undisclosed cash amount. Included in the acquisition is Schlumberger's Odyssey 300 system, which …
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Substrate/epi wafer inspection for LEDs: Excursion sensitivity matters
… KLA-Tencor also has debuted the KLARITY LED automated analysis and defect data management system and ICOS WI-2220 wafer inspection tool designed specifically for LED defect inspection. — D.V. Solid State Technology | Volume 54 | Issue 3 | March …
