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<title><![CDATA[RSS for Glass Frit]]></title>
<description><![CDATA[Glass Frit news and technical articles from Solid State Technology Magazine. Search Glass Frit latest and archived news and articles]]></description>
<link><![CDATA[http://www.electroiq.com/topics/]]></link>
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<title><![CDATA[STMicroelectronics is first $1 billion MEMS company]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/2013/02/stmicroelectronics-is-first--1-billion-mems-company.html]]></link>
<guid>http://www.electroiq.com/articles/sst/2013/02/stmicroelectronics-is-first--1-billion-mems-company.html</guid>
<pubDate><![CDATA[Wed, 27 Feb 2013 10:46:00 EST]]></pubDate>
<description><![CDATA[Yole Développement’s research has credited STMicroelectronics for capitalizing on the booming demand for MEMS in mobile devices by shipping 58% more MEMS units in 2012, to become the first company to reach $1 billion in MEMS sales.]]></description>
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<title><![CDATA[Think ink for increased efficiency]]></title>
<link><![CDATA[http://www.electroiq.com/articles/pvw/print/volume-2011/issue-6/features/think-ink-for-increased-efficiency.html]]></link>
<guid>http://www.electroiq.com/articles/pvw/print/volume-2011/issue-6/features/think-ink-for-increased-efficiency.html</guid>
<pubDate><![CDATA[Tue, 01 Nov 2011 11:16:00 EDT]]></pubDate>
<description><![CDATA[One dollar per watt: that’s the mark the solar industry is hoping to hit in order to become cost-competitive with conventional energies.]]></description>
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<title><![CDATA[Integration and 3D-ICs driving developments in wafer bonding]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/print/volume-54/issue-9/features/cover-article/integration-and-3d-ics-driving.html]]></link>
<guid>http://www.electroiq.com/articles/sst/print/volume-54/issue-9/features/cover-article/integration-and-3d-ics-driving.html</guid>
<pubDate><![CDATA[Sat, 01 Oct 2011 01:00:00 EDT]]></pubDate>
<description><![CDATA[Megatrends driving wafer bonding are heterogeneous and 3D integration.]]></description>
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<title><![CDATA[Wafer bonding: Many options for many devices]]></title>
<link><![CDATA[http://www.electroiq.com/articles/stm/2011/05/wafer-bonding-many.html]]></link>
<guid>http://www.electroiq.com/articles/stm/2011/05/wafer-bonding-many.html</guid>
<pubDate><![CDATA[Tue, 17 May 2011 13:55:00 EDT]]></pubDate>
<description><![CDATA[Wafer bonding is a complex process, used on 2" to 12" wafers for MEMS, image sensors, advanced packaging, LEDs, and other chips. Yole Développement published a technology study and market research report, "Permanent wafer bonding," to derive trends in the market and technology through 2016.]]></description>
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<title><![CDATA[Thermal oxidation and solar dryers]]></title>
<link><![CDATA[http://www.electroiq.com/articles/pvw/print/volume-20100/issue-5/features/thermal-oxidation-and-solar-dryers.html]]></link>
<guid>http://www.electroiq.com/articles/pvw/print/volume-20100/issue-5/features/thermal-oxidation-and-solar-dryers.html</guid>
<pubDate><![CDATA[Wed, 01 Sep 2010 12:00:00 EDT]]></pubDate>
<description><![CDATA[Thermal oxidation contributes to  a considerable reduction of potential condensation, which results in ...]]></description>
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<title><![CDATA[Wafer-to-wafer Bonding: Using Pressure-indicating Film for Eutectic/Thermocompression Bonds]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2009/08/wafer-to-wafer-bonding.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2009/08/wafer-to-wafer-bonding.html</guid>
<pubDate><![CDATA[Fri, 28 Aug 2009 15:25:40 EDT]]></pubDate>
<description><![CDATA[Kwan-yu Lai, Micralyne, and Jeffrey G. Stark, Sensor Products, describe the use of color-coded pressure-indicating film to ensure uniform, correct pressure during wafer bonding. Wafers are bonded by applying precise combinations of physical pressure, temperature, and/or voltage. Pressure is ...]]></description>
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<title><![CDATA[Pressure indicating film characterization of wafer-to-wafer bonding]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/print/volume-52/issue-8/features/wafer-bonding/pressure-indicating-film-characterization-of-wafer-to-wafer-bonding.html]]></link>
<guid>http://www.electroiq.com/articles/sst/print/volume-52/issue-8/features/wafer-bonding/pressure-indicating-film-characterization-of-wafer-to-wafer-bonding.html</guid>
<pubDate><![CDATA[Sat, 01 Aug 2009 01:08:00 EDT]]></pubDate>
<description><![CDATA[Wafers are bonded by applying precise combinations of physical pressure, temperature, and/or voltage. Pressure is measured as an average, assuming perfectly flat pressure plates. In practice, the pressure plates are often non-ideal, or they may have degraded over time. Applied pressure ...]]></description>
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<title><![CDATA[Flexible energy: Research on organic solar cells has entered an exciting phase]]></title>
<link><![CDATA[http://www.electroiq.com/articles/pvw/2009/01/flexible-energy__research.html]]></link>
<guid>http://www.electroiq.com/articles/pvw/2009/01/flexible-energy__research.html</guid>
<pubDate><![CDATA[Wed, 21 Jan 2009 11:05:40 EST]]></pubDate>
<description><![CDATA[Organic and dye-sensitized solar cells offer many intriguing possibilities, and although large-scale adoption is still some way off, the first commercial plants for off-grid and niche uses are due to come on-line in the next few years. By Iris Krampitz.]]></description>
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<title><![CDATA[Through-wafer Inspection for MEMS Devices — a Comparison]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/print/volume-18/issue-1/features/through-wafer-inspection-for-mems-devices-mdash-a-comparison.html]]></link>
<guid>http://www.electroiq.com/articles/ap/print/volume-18/issue-1/features/through-wafer-inspection-for-mems-devices-mdash-a-comparison.html</guid>
<pubDate><![CDATA[Thu, 01 Jan 2009 01:01:00 EST]]></pubDate>
<description><![CDATA[Defect detection within MEMS devices is vital to ensure their operation, but many mechanical properties cannot be determined through electrical or functional test.]]></description>
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<title><![CDATA[Enabling next-generation MEMS devices with metal eutectic bonding]]></title>
<link><![CDATA[http://www.electroiq.com/articles/stm/print/volume-8/issue-3/features/enabling-next-generation-mems-devices-with-metal-eutectic-bonding.html]]></link>
<guid>http://www.electroiq.com/articles/stm/print/volume-8/issue-3/features/enabling-next-generation-mems-devices-with-metal-eutectic-bonding.html</guid>
<pubDate><![CDATA[Mon, 01 Sep 2008 01:09:00 EDT]]></pubDate>
<description><![CDATA[Microelectrical-mechanical systems (MEMS) devices have experienced impressive and steady growth as they are integrated into people’s everyday lives.]]></description>
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