<?xml version="1.0" encoding="UTF-8"?>
<rss version="2.0">
<channel>
<title><![CDATA[RSS for Euv Lithography]]></title>
<description><![CDATA[Euv Lithography news and technical articles from Solid State Technology Magazine. Search Euv Lithography latest and archived news and articles]]></description>
<link><![CDATA[http://www.electroiq.com/topics/]]></link>
<atom:link xmlns:atom="http://www.w3.org/2005/Atom" type="application/rss+xml" rel="self" href="http://www.electroiq.com/topics/urss?pageid=488756"/>
<item>
<title><![CDATA[Extending optical lithography; outlook for DSA]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/2013/05/extending-optical-lithography--outlook-for-dsa.html]]></link>
<guid>http://www.electroiq.com/articles/sst/2013/05/extending-optical-lithography--outlook-for-dsa.html</guid>
<pubDate><![CDATA[Mon, 20 May 2013 12:00:00 EDT]]></pubDate>
<description><![CDATA[This year’s SEMICON West front-end processing TechXPOTs on lithography and transistors below 20nm will provide critical updates on how technologists are coping with the next scaling challenges.]]></description>
</item>
<item>
<title><![CDATA[Current and future defectivity issues for equipment components and materials]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/print/volume-56/issue-3/features/defects/current-and-future-defectivity-issues.html]]></link>
<guid>http://www.electroiq.com/articles/sst/print/volume-56/issue-3/features/defects/current-and-future-defectivity-issues.html</guid>
<pubDate><![CDATA[Wed, 01 May 2013 01:00:00 EDT]]></pubDate>
<description><![CDATA[The Nanodefect Center is tackling the big challenges in particle detection, characterization and mitigation for critical supply chain components and materials. VIBHU JINDAL, SEMATECH, Albany, NY]]></description>
</item>
<item>
<title><![CDATA[Confronting sub-20nm front-end challenges with the “duck and weave”]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/2013/04/confronting-sub-20nm-front-end-challenges-with-the-duck-and-weav.html]]></link>
<guid>http://www.electroiq.com/articles/sst/2013/04/confronting-sub-20nm-front-end-challenges-with-the-duck-and-weav.html</guid>
<pubDate><![CDATA[Wed, 24 Apr 2013 10:40:00 EDT]]></pubDate>
<description><![CDATA[Just as a boxer avoids a surprise shot to the head or torso by using a “duck and weave” maneuver, so to must front-end technologists confront the challenges associated with extending optical lithography while planning for EUV lithography’s eventual high-productivity solution.]]></description>
</item>
<item>
<title><![CDATA[Critical updates on EUV, 3D transistors and 450mm manufacturing at SEMICON West 2013]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/2013/04/critical-updates-on-euv--3d-transistors-and-450mm-manufacturing-.html]]></link>
<guid>http://www.electroiq.com/articles/sst/2013/04/critical-updates-on-euv--3d-transistors-and-450mm-manufacturing-.html</guid>
<pubDate><![CDATA[Tue, 23 Apr 2013 13:28:00 EDT]]></pubDate>
<description><![CDATA[The critical processes and technologies necessary to continue Moore’s Law are currently more uncertain than ever before in the history of advanced semiconductor manufacturing.]]></description>
</item>
<item>
<title><![CDATA[SEMATECH and Intermolecular partner to accelerate EUV lithography]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/2013/04/sematech-and-intermolecular-partner-to-accelerate-euv-lithograph.html]]></link>
<guid>http://www.electroiq.com/articles/sst/2013/04/sematech-and-intermolecular-partner-to-accelerate-euv-lithograph.html</guid>
<pubDate><![CDATA[Tue, 09 Apr 2013 10:24:00 EDT]]></pubDate>
<description><![CDATA[In an effort that will accelerate commercialization of extreme ultraviolet (EUV) lithography technology and the development of next-generation transistors, SEMATECH announced today that Intermolecular, Inc. has joined SEMATECH’s Lithography and Front End Processes (FEP) programs.]]></description>
</item>
<item>
<title><![CDATA[GLOBALFOUNDRIES partners with ASML for chip tape-outs]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/2013/03/globalfoundries-partners-with-asml-for-chip-tape-outs.html]]></link>
<guid>http://www.electroiq.com/articles/sst/2013/03/globalfoundries-partners-with-asml-for-chip-tape-outs.html</guid>
<pubDate><![CDATA[Wed, 20 Mar 2013 12:57:00 EDT]]></pubDate>
<description><![CDATA[Brion Technologies, a division of ASML, announced a major milestone today in its partnership with GLOBALFOUNDRIES. The companies are collaborating to deliver high-volume computational lithography capabilities for 28 nm and 20 nm tapeouts, while also accelerating the development of future nodes, ...]]></description>
</item>
<item>
<title><![CDATA[SEMICON West 2013 to address industry R&D challenges and opportunities]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/2013/03/semicon-west-2013-to-address-industry-r-d-challenges-and-opportu.html]]></link>
<guid>http://www.electroiq.com/articles/sst/2013/03/semicon-west-2013-to-address-industry-r-d-challenges-and-opportu.html</guid>
<pubDate><![CDATA[Tue, 19 Mar 2013 17:04:00 EDT]]></pubDate>
<description><![CDATA[Dynamic changes to R&D processes, tools, technical challenges, and funding/business models will be highlighted at SEMICON West 2013, along with product displays of the latest semiconductor manufacturing technology, components and subsystems.]]></description>
</item>
<item>
<title><![CDATA['Key' EUV milestone, DSA progress, more reported at SPIE Advanced Lithography]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/2013/03/-key--euv-milestone--dsa-progress--more-reported-at-spie-advance.html]]></link>
<guid>http://www.electroiq.com/articles/sst/2013/03/-key--euv-milestone--dsa-progress--more-reported-at-spie-advance.html</guid>
<pubDate><![CDATA[Thu, 07 Mar 2013 11:12:00 EST]]></pubDate>
<description><![CDATA[Over 2,000 industry professionals attended last week’s SPIE Advanced Lithography, where important progress reports were revealed on extreme ultraviolet (EUV), lithography, directed self-assembly (DSA), metrology, and related topics. The event ran February 24-28 in San Jose, California.]]></description>
</item>
<item>
<title><![CDATA[SEMATECH’s Bryan Rice named 2013 SPIE Fellow]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/2013/02/sematech_s-bryan-rice-named-2013-spie-fellow.html]]></link>
<guid>http://www.electroiq.com/articles/sst/2013/02/sematech_s-bryan-rice-named-2013-spie-fellow.html</guid>
<pubDate><![CDATA[Tue, 26 Feb 2013 11:46:00 EST]]></pubDate>
<description><![CDATA[SEMATECH announced today that Dr. Bryan J. Rice, on assignment from Intel Corporation as SEMATECH’s director of Strategic Initiatives, was inducted as a 2013 Fellow by SPIE, the international society for optics and photonics, during its annual SPIE Advanced Lithography conferences in San Francisco, ...]]></description>
</item>
<item>
<title><![CDATA[Gigaphoton achieves maximum 20W EUV light source output]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/2013/02/gigaphoton-achieves-maximum-20w-euv-light-source-output-.html]]></link>
<guid>http://www.electroiq.com/articles/sst/2013/02/gigaphoton-achieves-maximum-20w-euv-light-source-output-.html</guid>
<pubDate><![CDATA[Mon, 18 Feb 2013 13:04:00 EST]]></pubDate>
<description><![CDATA[Gigaphoton, Inc., a major lithography light source manufacturer, announced today that the company has achieved EUV light output equivalent to maximum of 20W for its laser-produced plasma, or LPP light sources for EUV lithography scanners.]]></description>
</item>
</channel>
</rss>
