<?xml version="1.0" encoding="UTF-8"?>
<rss version="2.0">
<channel>
<title><![CDATA[RSS for Computed Tomography]]></title>
<description><![CDATA[Computed Tomography news and technical articles from Solid State Technology Magazine. Search Computed Tomography latest and archived news and articles]]></description>
<link><![CDATA[http://www.electroiq.com/topics/]]></link>
<atom:link xmlns:atom="http://www.w3.org/2005/Atom" type="application/rss+xml" rel="self" href="http://www.electroiq.com/topics/urss?pageid=488732"/>
<item>
<title><![CDATA[A*STAR, SFC Fluidics develop point-of-need traumatic brain injury diagnostic device]]></title>
<link><![CDATA[http://www.electroiq.com/articles/stm/2012/12/a-star-sfc-fluidics-develop-point-of-need-traumatic-brain-injury-diagnostic-device.html]]></link>
<guid>http://www.electroiq.com/articles/stm/2012/12/a-star-sfc-fluidics-develop-point-of-need-traumatic-brain-injury-diagnostic-device.html</guid>
<pubDate><![CDATA[Tue, 04 Dec 2012 11:39:00 EST]]></pubDate>
<description><![CDATA[A*STAR's Institute of Microelectronics (IME) and SFC Fluidics will develop a portable diagnostic tool for rapid triaging of traumatic brain injury (TBI) victims.]]></description>
</item>
<item>
<title><![CDATA[Bruker bolsters CT imaging line with SkyScan buy]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2012/04/bruker-bolsters-ct-imaging-line-with-skyscan-buy.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2012/04/bruker-bolsters-ct-imaging-line-with-skyscan-buy.html</guid>
<pubDate><![CDATA[Mon, 02 Apr 2012 11:14:00 EDT]]></pubDate>
<description><![CDATA[Bruker Corporation acquired all of the shares of SkyScan NV, a scientific instruments company serving materials science and life sciences/pre-clinical imaging needs.]]></description>
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<title><![CDATA[Open microfocus X-ray tubes gain automatic venting]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2011/09/open-microfocus-x-ray-tubes-gain-automatic-venting.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2011/09/open-microfocus-x-ray-tubes-gain-automatic-venting.html</guid>
<pubDate><![CDATA[Thu, 22 Sep 2011 11:44:00 EDT]]></pubDate>
<description><![CDATA[X-RAY WorX GmbH introduced electronically controlled venting valves for open X-ray tubes. This avoids the manual venting typically performed during X-ray tool maintenance.]]></description>
</item>
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<title><![CDATA[3D CT X-ray imaging fills inspection gaps, says Xradia]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/print/volume-54/issue-5/departments/technology-news/3d-ct-x-ray-imaging-fills-inspection-gaps.html]]></link>
<guid>http://www.electroiq.com/articles/sst/print/volume-54/issue-5/departments/technology-news/3d-ct-x-ray-imaging-fills-inspection-gaps.html</guid>
<pubDate><![CDATA[Sun, 01 May 2011 01:00:00 EDT]]></pubDate>
<description><![CDATA[Xradia has unveiled its latest micro computed tomography (CT) 3D X-ray imaging system, the VersaXRM, targeting gaps in the semiconductor, materials science, geomaterials, and life sciences market segments.]]></description>
</item>
<item>
<title><![CDATA[3D CT X ray imaging fills inspection gaps says Xradia]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2011/03/3d-ct-x-ray-imaging-fills-inspection-gaps-says-xradia.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2011/03/3d-ct-x-ray-imaging-fills-inspection-gaps-says-xradia.html</guid>
<pubDate><![CDATA[Tue, 29 Mar 2011 13:10:20 EDT]]></pubDate>
<description><![CDATA[Xradia has unveiled its latest micro computed tomography (CT) 3D X-ray imaging system, the VersaXRM. Kevin Fahey, PhD, VP of marketing at Xradia, discusses how the new platform uses geometrical magnification in tandem with an X-ray microscope.]]></description>
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<title><![CDATA[GE-intros-CT-system-for-3D-metrology-and-analysis]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2010/11/ge-intros-ct-system-for-3d-metrology-and-analysis-.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2010/11/ge-intros-ct-system-for-3d-metrology-and-analysis-.html</guid>
<pubDate><![CDATA[Mon, 29 Nov 2010 15:30:40 EST]]></pubDate>
<description><![CDATA[The phoenix nanotom m, from GE´s Inspection Technologies business, has been developed for high resolution and high precision X-ray computed tomography (CT) in non-destructive 3D analysis and 3D metrology.]]></description>
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<title><![CDATA[CT X-ray tube cooling system released by X-RAY WorX]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2010/10/ct-x-ray-tube-cooling.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2010/10/ct-x-ray-tube-cooling.html</guid>
<pubDate><![CDATA[Tue, 19 Oct 2010 11:15:20 EDT]]></pubDate>
<description><![CDATA[X-RAY WorX presented its new concepts for the cooling of high resolution microfocus X-ray tubes. The company offers a new, modular cooling concept with an optimized internal cooling of the target inside the tube head.]]></description>
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<title><![CDATA[Technologists Investigate Challenges for 3D Interconnect Metrology]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2009/07/technologists-investigate-challenges-for-3d-interconnect-metrology.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2009/07/technologists-investigate-challenges-for-3d-interconnect-metrology.html</guid>
<pubDate><![CDATA[Wed, 01 Jul 2009 16:07:00 EDT]]></pubDate>
<description><![CDATA[July 1, 2009 -- To gain a better understanding of how new and existing wafer metrology technologies can be used, modified, or enhanced to measure and improve 3D interconnect processes, SEMATECH will host a workshop dedicated to 3D interconnect metrology on July 15 in conjunction with SEMICON West ...]]></description>
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<title><![CDATA[Nanolab Technologies Adds X-Ray Capabilities]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2009/07/nanolab-technologies-adds-x-ray-capabilities.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2009/07/nanolab-technologies-adds-x-ray-capabilities.html</guid>
<pubDate><![CDATA[Wed, 01 Jul 2009 15:07:00 EDT]]></pubDate>
<description><![CDATA[July 1, 2009 -- Xradia, Inc., a developer and manufacturer of high-resolution 3D X-ray imaging systems, announced a partnership with NanoLab Technologies. The companies will offer 3D X-ray imaging as part of a service model that enables customers in the electronics and semiconductor industry to ...]]></description>
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<title><![CDATA[Xradia adds 3-D X-ray capabilities to Nanolab Technologies]]></title>
<link><![CDATA[http://www.electroiq.com/articles/stm/2009/06/xradia-adds-3-d-x-ray-capabilities-to-nanolab-technologies.html]]></link>
<guid>http://www.electroiq.com/articles/stm/2009/06/xradia-adds-3-d-x-ray-capabilities-to-nanolab-technologies.html</guid>
<pubDate><![CDATA[Tue, 09 Jun 2009 17:06:00 EDT]]></pubDate>
<description><![CDATA[June 9, 2009: Xradia Inc. and NanoLab Technologies Inc. have formed a partnership to offer 3D X-ray imaging as part of a service model to help address semiconductor packaging development and failure analysis challenges.]]></description>
</item>
</channel>
</rss>
