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<title><![CDATA[RSS for Capillary Underfill]]></title>
<description><![CDATA[Capillary Underfill news and technical articles from Solid State Technology Magazine. Search Capillary Underfill latest and archived news and articles]]></description>
<link><![CDATA[http://www.electroiq.com/topics/]]></link>
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<title><![CDATA[Halogen-free underfill uncrated at Henkel]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2011/11/halogen-free-underfill-uncrated-at-henkel.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2011/11/halogen-free-underfill-uncrated-at-henkel.html</guid>
<pubDate><![CDATA[Wed, 02 Nov 2011 15:13:00 EDT]]></pubDate>
<description><![CDATA[Henkel will launch several new electronics assembly materials at Productronica, November 15-18 in Munich, Germany.  The new HYSOL underfill is a halogen free, reworkable epoxy capillary underfill with a high T g .]]></description>
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<title><![CDATA[3D ICs in the spotlight at IMAPS]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2010/11/3d-ics-in-the-spotlight.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2010/11/3d-ics-in-the-spotlight.html</guid>
<pubDate><![CDATA[Thu, 11 Nov 2010 13:35:20 EST]]></pubDate>
<description><![CDATA[Talks at the recent IMAPS annual meeting in Raleigh, NC put 3D ICs and through-silicon vias under the spotlight, reports Dr. Phil Garrou -- lowering costs, fixing test problems, developing standards, and who will eventually pay for it all (hello memory!).]]></description>
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<title><![CDATA[Flip chip PoP is perfect for mobile, if done right]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2010/11/flip-chip-pop-is-perfect.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2010/11/flip-chip-pop-is-perfect.html</guid>
<pubDate><![CDATA[Wed, 10 Nov 2010 14:30:20 EST]]></pubDate>
<description><![CDATA[Package-on-package, implemented with flip chip package assembly, is meeting requirements for next-gen mobile devices. Challenges remain: fine pitch underfill, brittleness of ultra low- k (ULK) dielectrics, and shorting between adjacent bumps. Craig Mitchell, Tessera, examines the lucrative 3D ...]]></description>
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<title><![CDATA[Henkel releases NCP for copper pillar interconnect]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2010/07/henkel-releases-ncp.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2010/07/henkel-releases-ncp.html</guid>
<pubDate><![CDATA[Mon, 26 Jul 2010 13:05:50 EDT]]></pubDate>
<description><![CDATA[Henkel’s Hysol FP5201 NCP offers the underfill protection required for Cu Pillar technology, effectively mitigating the stress between the substrate and the die.]]></description>
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<title><![CDATA[Improving package-on-package reliability: a multi-material approach]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/print/volume-53/issue-5/features/pop-_package-on-package/improving-package-on-package.html]]></link>
<guid>http://www.electroiq.com/articles/sst/print/volume-53/issue-5/features/pop-_package-on-package/improving-package-on-package.html</guid>
<pubDate><![CDATA[Sat, 01 May 2010 01:00:00 EDT]]></pubDate>
<description><![CDATA[Incorporating proven, high reliability materials at all layers of the device — from the package level to the board level — will go a long way toward advancing electronics technology, especially for the handheld sector. Mark Currie, Henkel Corporation, Irvine, CA USA]]></description>
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<title><![CDATA[Analyst: 2H09 recovery for DRAM…maybe]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/print/volume-52/issue-2/departments/world-news/analyst-2h09-recovery-for-dramhellipmaybe.html]]></link>
<guid>http://www.electroiq.com/articles/sst/print/volume-52/issue-2/departments/world-news/analyst-2h09-recovery-for-dramhellipmaybe.html</guid>
<pubDate><![CDATA[Sun, 01 Feb 2009 01:02:00 EST]]></pubDate>
<description><![CDATA[2008 was a big game of “chicken” in the DRAM sector, as firms floored their investment and output pedals in 2008 hoping competitors would give up first.]]></description>
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<title><![CDATA[VOTE! Participate in the Sixth Annual Attendee's Choice Awards]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/2008/07/vote-participate-in-the-sixth-annual-attendees-choice-awards.html]]></link>
<guid>http://www.electroiq.com/articles/sst/2008/07/vote-participate-in-the-sixth-annual-attendees-choice-awards.html</guid>
<pubDate><![CDATA[Mon, 07 Jul 2008 15:07:00 EDT]]></pubDate>
<description><![CDATA[Let your choices be known! Vote for the Attendees' Choice Award at SEMICON West. Pick up your ballots for the two separate competitions: wafer processing products and final manufacturing products at the PennWell booth #345 in the South Hall.]]></description>
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<title><![CDATA[Epoxy Flux Technology]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2008/05/epoxy-flux-technology.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2008/05/epoxy-flux-technology.html</guid>
<pubDate><![CDATA[Fri, 02 May 2008 15:05:00 EDT]]></pubDate>
<description><![CDATA[Hysol FF6000, from the electronics group at Henkel, is a reflow curable material formulated to provide flux for lead-free solder joint formation and, when cured, delivers protection against mechanical stress. Unlike traditional capillary underfill processes, this material enables an in-line ...]]></description>
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<title><![CDATA[Flip Chip’s Midlife Crisis]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/print/volume-17/issue-4/features/cover-story/flip-chiprsquos-midlife-crisis.html]]></link>
<guid>http://www.electroiq.com/articles/ap/print/volume-17/issue-4/features/cover-story/flip-chiprsquos-midlife-crisis.html</guid>
<pubDate><![CDATA[Tue, 01 Apr 2008 01:04:00 EDT]]></pubDate>
<description><![CDATA[The negatives of lead-free solders have triggered a growing renaissance in tried-and-true flip chip technologies, as improved equipment and new applications boost twentieth-century approaches.]]></description>
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<title><![CDATA[Flux and Underfill Compatibility in a Lead-free Environment]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/print/volume-16/issue-6/features/the-back-end-process/flux-and-underfill-compatibility-in-a-lead-free-environment.html]]></link>
<guid>http://www.electroiq.com/articles/ap/print/volume-16/issue-6/features/the-back-end-process/flux-and-underfill-compatibility-in-a-lead-free-environment.html</guid>
<pubDate><![CDATA[Wed, 01 Aug 2007 01:08:00 EDT]]></pubDate>
<description><![CDATA[Since their introduction nearly 20 years ago, the benefits of integrating flip chips into modern devices have been well proven.]]></description>
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