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<title><![CDATA[RSS for Wafer Packaging]]></title>
<description><![CDATA[Wafer Packaging news and technical articles from Solid State Technology Magazine. Search Wafer Packaging latest and archived news and articles]]></description>
<link><![CDATA[http://www.electroiq.com/topics/]]></link>
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<title><![CDATA[Rudolph sells metrology tool for back-end wafer packaging processes]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2012/02/rudolph-sells-metrology-tool-for-back-end-wafer-packaging-processes.html]]></link>
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<pubDate><![CDATA[Mon, 06 Feb 2012 13:43:00 EST]]></pubDate>
<description><![CDATA[Rudolph Technologies (NASDAQ:RTEC) delivered the first MetaPULSE metrology system to measure under bump metallization (UBM) and redistribution layers (RDL) in advanced package manufacturing.]]></description>
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<title><![CDATA[Fan-in WLCSP outpaces semiconductor packaging market]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2011/12/fan-in-wlcsp-outpaces-semiconductor-packaging-market.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2011/12/fan-in-wlcsp-outpaces-semiconductor-packaging-market.html</guid>
<pubDate><![CDATA[Thu, 22 Dec 2011 11:00:00 EST]]></pubDate>
<description><![CDATA[Yole identifies the fan-in wafer-level chipscale packaging (WLCSP) market for strong growth, and a diverse base of chip technologies. Fan-in WLCSP reached 2.3 million 300mm-equivalent wafers shipped in 2011, or about $1.7 billion in revenue.]]></description>
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<title><![CDATA[What's driving MEMS commercialization]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/print/volume-54/issue-9/columns/mems/what-s-driving-mems.html]]></link>
<guid>http://www.electroiq.com/articles/sst/print/volume-54/issue-9/columns/mems/what-s-driving-mems.html</guid>
<pubDate><![CDATA[Sat, 01 Oct 2011 01:00:00 EDT]]></pubDate>
<description><![CDATA[In my annual "Commercialization Report Card" market study, the MEMS industry infrastructure is one of 14 critical success factors.]]></description>
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<title><![CDATA[Wafer packaging database provides WLP data]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2011/09/wafer-packaging-database-provides-wlp-data.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2011/09/wafer-packaging-database-provides-wlp-data.html</guid>
<pubDate><![CDATA[Fri, 23 Sep 2011 15:07:00 EDT]]></pubDate>
<description><![CDATA[Research and Markets released "Wafer Packaging Fab Database," providing a global overview over 150 companies' 250+ mid-end semiconductor packaging houses.]]></description>
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<title><![CDATA[Thin-wafer bond/debond metrology from EVG opens process control, supply chain possibilities]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2011/06/thin-wafer-bond-debond-metrology-evg-opens-process-control-supply-chain-possibilities.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2011/06/thin-wafer-bond-debond-metrology-evg-opens-process-control-supply-chain-possibilities.html</guid>
<pubDate><![CDATA[Tue, 21 Jun 2011 10:39:00 EDT]]></pubDate>
<description><![CDATA[EV Group (EVG) added an in-line metrology module for its EVG850TB/DB automated temporary bonding and debonding systems.]]></description>
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<title><![CDATA[RF MEMS packaging collab DelfMEMS KFM]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2011/02/rf-mems-packaging-collab-delfmems-kfm.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2011/02/rf-mems-packaging-collab-delfmems-kfm.html</guid>
<pubDate><![CDATA[Tue, 01 Feb 2011 13:40:40 EST]]></pubDate>
<description><![CDATA[DelfMEMS and KFM Technology signed a common agreement to combine their expertise in RF micro-electro-mechanical systems (MEMS) and thin film packaging (TFP) technology. DelfMEMS will use the collaboration to provide packaged MEMS switches, fixed capacitors, and high-Q inductors on the same chip.]]></description>
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<title><![CDATA[SMTA Announces "Best of Conference" Award for Pan Pacific 2008 Symposium]]></title>
<link><![CDATA[http://www.electroiq.com/articles/ap/2008/03/smta-announces-best-of-conference-award-for-pan-pacific-2008-symposium.html]]></link>
<guid>http://www.electroiq.com/articles/ap/2008/03/smta-announces-best-of-conference-award-for-pan-pacific-2008-symposium.html</guid>
<pubDate><![CDATA[Fri, 07 Mar 2008 11:03:00 EST]]></pubDate>
<description><![CDATA[(March 7, 2008) Minneapolis, MN  The SMTA has announced "Best of Conference Awards" to two presenters from this year's Annual Pan Pacific Microelectronics Symposium and Tabletop Exhibition, held in late January in Hawaii. These awards are chosen by attendee ratings.]]></description>
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<title><![CDATA[RF Micro Devices introduces MEMS for 3G phones]]></title>
<link><![CDATA[http://www.electroiq.com/articles/stm/2007/11/rf-micro-devices-introduces-mems-for-3g-phones.html]]></link>
<guid>http://www.electroiq.com/articles/stm/2007/11/rf-micro-devices-introduces-mems-for-3g-phones.html</guid>
<pubDate><![CDATA[Mon, 19 Nov 2007 07:11:00 EST]]></pubDate>
<description><![CDATA[RF Micro Devices, designer and manufacturer of high-performance radio frequency systems, has introduced RF MEMS transmit/receive switch and mode switch for 3G (third generation) mobile phone handsets.]]></description>
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<title><![CDATA[Product news]]></title>
<link><![CDATA[http://www.electroiq.com/articles/sst/print/volume-49/issue-11/departments/product-news/product-news.html]]></link>
<guid>http://www.electroiq.com/articles/sst/print/volume-49/issue-11/departments/product-news/product-news.html</guid>
<pubDate><![CDATA[Wed, 01 Nov 2006 01:11:00 EST]]></pubDate>
<description><![CDATA[The Candela Optical Surface Analyzer 6300 series provides full surface disk topography metrology in both radial and circumferential directions for data storage substrates and finished media.]]></description>
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<title><![CDATA[News & Products]]></title>
<link><![CDATA[http://www.electroiq.com/articles/mlw/print/volume-15/issue-4/departments/news-and-products/news-amp-products.html]]></link>
<guid>http://www.electroiq.com/articles/mlw/print/volume-15/issue-4/departments/news-and-products/news-amp-products.html</guid>
<pubDate><![CDATA[Wed, 01 Nov 2006 01:11:00 EST]]></pubDate>
<description><![CDATA[At the 3rd annual International Symposium on Immersion Lithography in Kyoto, Japan (Oct.]]></description>
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