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Test System

Test System news and technical articles from Solid State Technology Magazine. Search Test System latest and archived news and articles

  1. IPCore Chooses Agilent Test System to Build on Design, Test Services in China

    Online Articles

    Wed, 9 Nov 2005

    November 9, 2005) Palo Alto, Calif. — IPCore Technologies Corp. has selected Agilent Technologies' 93000 SOC Series test system to expand its digital, mixed-signal, and RF device test services into such applications as high-definition television

  2. BridgePoint Purchases SoC Test System from Teradyne

    Online Articles

    Tue, 29 Aug 2000

    a subcontract production and engineering test services company, purchased a Catalyst test system from Teradyne. The system-on-chip (SoC) test system will be used to test its customers' high-end mixed-signal devices. By pennNET Staff

  3. Carsem Installs Teradyne Test

    Online Articles

    Thu, 9 Aug 2007

    manufacturer in Japan. The country provides advanced electronic components and products, said Charles Johnston, president and CEO, Qualmark, adding that this niche suits use of accelerated test systems to help bring products to market.

  4. Aehr Test Systems Announces Acceptance of First FOX-15 System

    Online Articles

    Mon, 24 Mar 2008

    (March 24, 2008) Fremont, CA Aehr Test Systems has announced it has received customer acceptance on the first FOX-15 wafer-level burn-in system from a major automotive IC manufacturer. Revenue for this system will be recognized in fiscal 4Q08.

  5. MLCC manufacturers order ESI high-throughput test system

    Online Articles

    Tue, 3 Jul 2012

    which makes laser-based tools for microelectronics manufacturing , received multiple-unit orders for its model 3510 test system from leading Japanese and Korean electronic components manufacturers. The customers are expanding production of small-geometry

  6. SUSS Installs First 300-mm WLR Test System

    Online Articles

    Tue, 8 Apr 2008

    (April 8, 2008) Yokohama, JAPAN — SUSS MicroTec AG announced the first installation of its PM300WLR, said to be the world's first dedicated 300-mm wafer-level reliability (WLR) test system , at a leading Japanese semiconductor device manufacturer. According to the company, it will be used for ...

  7. SUSS MicroTec, Instrument Systems Form Test System Partnership

    Online Articles

    Mon, 13 Mar 2006

    (March 13, 2006) Munich, Germany — SUSS MicroTec and Instrument Systems have formed a strategic partnership to develop a next-generation, high-throughput test system for LED devices at wafer-level that tests up to 70,000 LED dies per hour.

  8. National IC Design Industrialization Base Purchases Teredyne Test System

    Online Articles

    Wed, 27 Sep 2006

    (September 27, 2006) SHANGHAI, CHINA Teredyne announced the sale of their J750 test system to the National IC Design Industrialization Base, Hangzhou (HICC) to meet the demands of local IC design houses in the ZheJiang

  9. Stress Test System

    Magazine Articles

    Tue, 1 Feb 2000

    The Accelerated Stress Test system can demonstrate in hours how a product will hold up after years of use. The system applies environmental stresses that accelerate

  10. Credence unveils IC test system

    Online Articles

    Mon, 18 Aug 2003

    August 14, 2003 - Credence Systems, Fremont, CA, has introduced an engineering validation test system for testing IC designs. The IMS Vanguard 250 is geared for testing consumer ICs in devices such as DVD players, game consoles, and mobile devices.

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