Test System
Test System news and technical articles from Solid State Technology Magazine. Search Test System latest and archived news and articles
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Advantest DRAM test system clocks 8Gbps test speed on every pin
… ATE) uncrated the next-generation high-speed memory test system , T5511, offering 8Gbps test speed. Designed for dynamic ..... the entire library of program data created for T55xx series test systems . System configurations range from 384 pins for R&D use …
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Keithley Instruments upgrades semiconductor test software suite
… January 26, 2012 - BUSINESS WIRE -- Test system maker Keithley Instruments Inc. upgraded ..... with Keithley’s S500 Integrated Test Systems . The updated reliability test module ..... compression techniques that allow the test system to capture the most important measurement …
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Burn-in and test system offers device-by-device temperature control
Micro Control Company uncrated the HPB-5C High-Power Burn-In System, with variable airflow control for active thermal control of each device under test. The HPB-5C provides individual temperature control to each device under test.
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Theta Delta's burn-in & long-term semiconductor testers gain Core Wafer Systems technologies
… technologies into its burn-in test and long-term reliability test systems for semiconductors . Core Wafer Systems provides parallel ..... s semiconductor and nanotechnology business and magnetics test systems unit as a third revenue stream. "This alliance positions …
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Tektronix buys Teradyne testers for better test dev, IC test range
June 8, 2011 - PR Newswire -- Tektronix Component Solutions purchased 5 Teradyne J750EX semiconductor test systems to screen a wider variety of complex ASICs, increase test capacity, and generate test programs faster. Tektronix offers test …
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Teradyne tester boasts high throughput of consumer digital chips
… Teradyne (NYSE:TER) uncrated its Magnum semiconductor test system with a proprietary scalable chassis design and tester-per ..... test dev, IC test range Teradyne will showcase the Magnum test system with high density precision analog instrumentation for consumer …
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Air-cooled wafer probe chuck debuts in modular format
October 17, 2011 -- ERS uncrated the ERS AirCool 3 wafer thermal test system at last week's SEMICON Europa in Germany. ERS designs air-cooled thermal chucks for wafer test because of increased in-field …
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Unisem adds LTX-Credence tester to US test dev center
August 1, 2011 - BUSINESS WIRE -- SATS provider Unisem purchased a LTX-Credence PAx RF Test System for its Sunnyvale, CA, test development center. The system includes the full feature set LTX-Credence offers for development …
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Multitest position detection system prevents jams in test handlers
September 1, 2011 -- Test system maker Multitest reports improved tested-device placement with MT2168 at a high-volume semiconductor production site in Asia …
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Multitest launches MEMS microphone tester with European order
… 2011 -- Test equipment maker Multitest shipped the first InPhone system to an IDM’s European site. The InPhone microphone test system can be combined with the Multitest InStrip test handler for highly parallel micro electro mechanical system (MEMS) test …
