Test System
Test System news and technical articles from Solid State Technology Magazine. Search Test System latest and archived news and articles
-
Advantest DRAM test system clocks 8Gbps test speed on every pin
… ATE) uncrated the next-generation high-speed memory test system , T5511, offering 8Gbps test speed. Designed for dynamic ..... the entire library of program data created for T55xx series test systems . System configurations range from 384 pins for R&D use …
-
Keithley Receives Repeat Order for Test System
(March 15, 2005) Cleveland — Keithley Instruments has received a repeat multiple-system order for its S680 DC/RF Parametric Test Systems from Icheon, Korea-based Hynix Semiconductor Inc.
-
Flash memory maker orders additional Aehr full-wafer test tool
… equipment maker Aehr Test Systems ( Nasdaq:AEHR ) will ..... FOX-1 full-wafer test system at a leading flash memory ..... of marketing at Aehr Test Systems . The FOX-1 tester ..... laser diodes). Aehr Test Systems is a worldwide provider …
-
Plate design and cost of ownership for in process FPD test systems
… the probing-based test system will have short MTBF ..... is lower and an extra test system is required. It is ..... the probing-based test systems . From Table 7, it ..... or a probing-based test system , $60 or $55 million …
-
SemiProbe patent for modular test system approved
… to configure test and inspection systems that meet unique requirements usually served by custom products. For traditional test systems , Probe System for Life allows the user to configure the station with exactly what they need and can budget for instead of …
-
Aehr Test Sells Newest Test System to IC Manufacturer
(February 17, 2005) Fremont, Calif. — Aehr Test Systems announces it has received the first order for its next ..... needs," says Carl Buck, VP of marketing for Aehr Test Systems . "It can perform monitored burn-in on over 12 …
-
Expanded CV test system
Expanded CV test systems The System 80 Series of CV measurement instruments has been expanded to include I-V testing, analysis software, and integration …
-
ZILOG to Use SZ Testsysteme Test System
SUNNYVALE, Calif. June 16, 2000 ZILOG has purchase one of SZ Testsysteme AG's M3650 mixed signal test systems . By pennNET Staff
-
UTAC loads up on LTX test tools
… purchase agreement to adopt LTX Corp.'s X-Series Fusion CX test systems for its test facilities in Singapore, Taiwan, and China ..... shortest test times. UTAC previously selected LTX's CX RF test system for their Taiwan operations.
-
Visual Test System
Electro Scientific Industries' Model 6680 Visual Test System for 2 and 3D inspection of ceramic components reportedly ..... yielding first-generation model, 6660A. This vision test system automatically sorts and inspects surface-mount MLCC …
