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  1. New LTXC semiconductor test tools suit ASSP, RF test

    Article

    Mon, 19 Mar 2012

    released the Diamond x test platform for application-specific ..... work across multiple test platforms . It will be available ..... available for Diamond test platform and will be available ..... Diamond and X-Series test platforms . LTX-Credence is

  2. Presto installs LTX-Credence semiconductor test platform for RF wireless devices

    Article

    Thu, 15 Mar 2012

    Engineering founder and CEO. Also read: Handling and test for RF devices by J. R. Schenk and Ken Kolden The X-Series test platform , available in multiple configurations, supports a suite of DC, power, DSP, RF and digital instrumentation for mixed

  1. Verigy wins Freescale test equipment order

    Article

    Wed, 6 Apr 2011

    Semiconductor's Networking and Multimedia Group (NMG), which has placed a volume order for Verigy's V93000 scalable test platform to use in testing select QorIQ PowerPC communications microprocessors, based on Power Architecture technology. Freescale

  2. New Products

    Article

    Sun, 1 Apr 2012

    com "> www.keithley.com . Test tools suit ASSP, RF test ATE provider LTX-Credence Corporation released the Diamondx test platform for application-specific standard products (ASSP) and the DragonRF for radio frequency (RF) devices. In addition

  3. 300-450mm manual wafer test probe configuration out from SemiProbe

    Article

    Wed, 22 Jun 2011

    test results to the wafer map for export data to other systems downstream. The Probe System for Life (PS4L) universal test platform provides a perpetual upgrade path; users can change stages or add components to allow the system to meet unique or different

  4. Multitest MEMS tester performs earth magnetic test

    Article

    Tue, 2 Aug 2011

    configuration provides high magnetic force at the highest accuracy. The MT MEMS tester is part of Multitest's modular MEMS test platform , targeting low-cost test and incorporating multiple degrees of freedom (DOF) test. It can be combined with low-g

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