Test Cell news and technical articles from Solid State Technology Magazine. Search Test Cell latest and archived news and articles
PV) solar cell efficiency record of 17.3% with a test cell fabbed with commercial-scale manufacturing equipment and materials. The test cell 's performance was confirmed by the US Department of
DuraKelvin required cleaning after approximately 100 hours, reducing cleaning-related test cell downtime by 90% compared to the original test cell configuration at the IDM. Multitest manufactures test equipment for semiconductors: test handlers
wafer test. Custom ICs, and advanced multichip module (MCM) packaging, enhance tester resource sharing to increase test cell parallelism. DRAM manufacturers and test houses can use the SmartMatrix 100XP on new and existing test equipment. The