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  1. First Solar CdTe cell sets efficiency record

    Article

    Tue, 26 Jul 2011

    PV) solar cell efficiency record of 17.3% with a test cell fabbed with commercial-scale manufacturing equipment and materials. The test cell 's performance was confirmed by the US Department of

  2. IDM records lower cost of test with Multitest DuraKelvin

    Article

    Mon, 4 Jul 2011

    DuraKelvin required cleaning after approximately 100 hours, reducing cleaning-related test cell downtime by 90% compared to the original test cell configuration at the IDM. Multitest manufactures test equipment for semiconductors: test handlers

  1. FormFactor next-gen DRAM tester contacts 850+ die in parallel

    Article

    Wed, 8 Jun 2011

    wafer test. Custom ICs, and advanced multichip module (MCM) packaging, enhance tester resource sharing to increase test cell parallelism. DRAM manufacturers and test houses can use the SmartMatrix 100XP on new and existing test equipment. The

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