Test And Reliability
Test And Reliability news and technical articles from Solid State Technology Magazine. Search Test And Reliability latest and archived news and articles
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JEDEC revises package inspection standard JESD9B
The JEDEC Solid State Technology Association published a significant revision to JESD9B, Inspection Criteria for Microelectronic Packages and Covers.
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DCG Systems acquires Thermosensorik, accesses new customer sectors
DCG acquired Thermosensorik GmbH, a leading provider of infrared non-destructive testing (IR NDT) products for the semiconductor, photovoltaic, and weld inspection markets.
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Olympus inspects bonded wafers with IR microscopy
Greg Baker, Olympus Integrated Technologies America, discusses why the company chose to focus its efforts on IR metrology for defect inspection of bonded wafers. Olympus-ITA launched the latest 3DIR Metrology and Defect Review System at SEMICON West 2011, booth 1524.
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Extending optical lithography with complementary e-beam lithography
David Lam summarizes how the industry does not have to "throw out" optical lithography as it proceeds to more advanced nodes -- complementary e-beam lithography (CEBL) is part of the overall solution, "complementary lithography," that can overcome the resolution limitations of 193i technology.
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Metryx joins semiconductor equipment assessment group SEAL
Metryx will work with IMEC and Intel via the joint European Semiconductor Equipment Assessment Leveraging Innovation (SEAL) project to assess high-resolution mass metrology viability at 20nm and smaller nodes.
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Proper PV labeling: How to install a PV system that meets IFC/NEC labeling standards
Todd Fries, HellermannTyton, describes recent fire and electrical codes that affect solar photovoltaics (PV) installations, debunking some myths and describing what installers need to know to pass inspection and properly label PV systems.
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Nordson opens China demo center
Nordson Corporation (NASDAQ:NDSN) opened a demo center in Dongguan, China for customers of its Advanced Technology Systems operating segment: Nordson ASYMTEK, Nordson DAGE, and Nordson YESTECH brands.
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KLAC FabVision Solar: Getting to the root of yield issues
KLA-Tencor (KLAC) debuted an integrated product to help solar photovoltaics (PV) cell manufacturers improve production yield. FabVision Solar captures all the measurement inspection data throughout the manufacturing process including measured data, images, and defect information, according to David
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IDM records lower cost of test with Multitest DuraKelvin
Multiest released data from an international IDM's high-volume production site, tracking its DuraKelvin test contactor's FPY and cleaning downtime.
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Plasma tool from Nordson MARCH handles 5 wafer sizes
Nordson MARCH introduced the FlexTRAK-WF low-cost, cassette-based automated plasma treatment system that handles five wafer sizes with minimal hardware change-over.
