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Sram

Sram news and technical articles from Solid State Technology Magazine. Search Sram latest and archived news and articles

  1. Improved SRAM detection through scattered light collection

    Print

    Sat, 1 Oct 2011

    optical scheme for inspection of advanced SRAM patterns offers enhanced defect signal ..... patterns. The second type of pattern is the SRAM , which is typically characterized as a ..... pattern. Scattered light detection on SRAM patterns, based on scattered light and

  2. Imec: FinFET beat planar for bigger SRAMs

    Article

    Fri, 17 Jun 2011

    slightly outperforms FinFETs for single SRAM cells, but FinFETs "clearly outperform ..... memory and (for the first time) full SRAM arrays -- and both FinFET varieties came out on top for medium/large SRAM arrays. They are also less sensitive

  1. Semiconductor yield improvement with scan diagnosis

    Article

    Fri, 18 Nov 2011

    inline process monitor product with basic SRAM structure. These products are not from ..... designed and taped out by the foundry. SRAM products use the same process as logic ..... advantages from a yield ramp point of view. An SRAM design is very simple, with repeated structures

  2. SuVolta's DDC transistor technology @ IEDM

    Article

    Thu, 8 Dec 2011

    operation of static random access memory ( SRAM ) blocks down to 0.425V by integrating ..... two companies have verified that a 576Kb SRAM can work well at approximately 0.4V by ..... have passed. Figure 2. Yield of 576k SRAM macro as a function of supply voltage

  3. Attend joint sessions at VLSI Technology and Circuits

    Article

    Tue, 10 Apr 2012

    June 13) - 3-D System Integration (Wednesday afternoon) - Emerging Non-Volatile Memory (Wednesday afternoon) - Advanced SRAM (Thursday morning, June 14) - Design in Scaled Technologies (Thursday morning) - Design Enablement in Scaled CMOS (Thursday

  4. Mobile SoCs can have low power without dopants, says SuVolta

    Article

    Mon, 6 Jun 2011

    technology's exceptionally low-voltage SRAM operation (Figs. 2 and 3). Listen to ..... Figure 2: Exceptionally low-voltage SRAM operation. (SOURCE: SuVolta) Regarding ..... less leakage power. Figure 3: 5× lower SRAM leakage demonstrated. (SOURCE: SuVolta

  5. Mobile SoCs can have low power without dopants, says SuVolta

    Print

    Mon, 11 Jul 2011

    Figure 2. Exceptionally low-voltage SRAM operation. (Source: SuVolta) Scott Thompson ..... technology's exceptionally low-voltage SRAM operation ( Figs. 2 and 3 ). Figure 3. 5 x lower SRAM leakage demonstrated. (Source: SuVolta

  6. At 22nm, the focus is first order effects

    Article

    Thu, 29 Dec 2011

    example of the need for 3D TCAD simulation is in the process optimization of SRAM cells, where stress and doping proximity effects require that all transistors comprising the SRAM be simulated in a single structure. This type of TCAD simulation has only

  7. KLA-Tencor uncrates metrology line-up for leading-edge semiconductor wafers

    Article

    Fri, 20 Jan 2012

    capture in yield-critical die areas, such as the edges of SRAM arrays, memory transition regions, and page breaks. Upgradeable ..... inside deep trenches and vias, or at the very edges of DRAM and SRAM arrays. The line offers high enough throughput to scan large

  8. Technical forecast: 22nm devices

    Article

    Sun, 1 Jan 2012

    of the need for 3-D TCAD simulation is in the process optimization of SRAM cells where stress and doping proximity effects require that all transistors comprising the SRAM be simulated in a single structure. This type of TCAD simulation has only

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