Scanning Electron Microscope
Scanning Electron Microscope news and technical articles from Solid State Technology Magazine. Search Scanning Electron Microscope latest and archived news and articles
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FEI announces new scanning electron microscope
… 12, 2003 -- FEI Co. , a Hillsboro, Ore., developer of metrology products, announced release of a new scanning electron microscope . The Quanta environmental SEM is intended for various applications in the materials, life sciences, automotive …
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FEI announces new scanning electron microscope
… released the newest member of its Nova family of scanning electron microscope and DualBeam systems, the Nova NanoSEM. The ..... world's first low-vacuum, field emission scanning electron microscope solution for ultra-high resolution characterization …
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Scanning electron microscope (SEM)/electron
Scanning electron microscope (SEM)/electron
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MIT adds TESCAN SEM for nano MEMS microfluidics studies
… March 8, 2011 - BUSINESS WIRE -- TESCAN, scanning electron microscope and focused ion beam workstation maker, delivered a VEGA 3 scanning electron microscope (SEM) to the Massachusetts Institute of Technology …
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FEI presents high-rez SEM at Pittcon 2009
… FEI Co. introduced a new high-resolution scanning electron microscope at Pittcon 2009 . The new Magellan extreme high-resolution scanning electron microscope ( XHR SEM ) extends SEM to applications that …
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Literature Update
NEWS Adding another piece to its inspection and metrology framework, KLA-Tencor will acquire scanning electron microscope manufacturer Amray Inc., Bedford, MA, in a stock swap deal. KLA-Tencor sees the acquisition as a fast …
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2013: Accelerating R&D and decreasing time to yield
… dimensions of a few tens of nanometers. Equally important, it has also driven demand for the focused ion beam/ scanning electron microscope (FIB/SEM) systems needed to create ultrathin samples from precise locations on a die. We have invested …
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Advancing CNTs for next-gen chips
… resistance and move to the next level of device performance." The low-temperature EBID process takes place in a scanning electron microscope (SEM) modified for material deposition -- the vacuum chamber is altered to introduce materials precursors …
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Electron backscatter diffraction arrives at EAG for crystalline material characterization
… analytical and testing services. EBSD characterizes the grain structure of crystalline materials, using a scanning electron microscope (SEM) beam to scan a sample and collect diffraction patterns from every point in the SEM image. Users gain …
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FEI’s extreme-high-resolution SEM enables metrology on semiconductors
… NASDAQ:FEIC), imaging and analysis systems maker, launched the Verios extreme-high-resolution (XHR) scanning electron microscope (SEM) for metrology on beam-sensitive and sub-namometer-scale materials in advanced semiconductors …
