Scanning Electron Microscope
Scanning Electron Microscope news and technical articles from Solid State Technology Magazine. Search Scanning Electron Microscope latest and archived news and articles
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Nanoimprinted anti-reflective plastics improve viewing angle on next-gen displays
… angles with less glare on televisions, and larger light-absorption areas on organic solar cells. Figure. Scanning electron microscope (SEM) image showing the engineered anti-reflective nanostructures (left) that mimic structures found …
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Evolution or revolution: the path for metrology beyond the 22nm node
… also critical process control variables. Some of the critical metrology steps entail critical dimension- scanning electron microscope (CD-SEM) measurements (resist and etch fin and gate CD and pitch; spacer width at the bottom; pre- and …
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Optical nano-antennae tune display colors depending on polarization
… and the background change color. The image at far right shows the antennas themselves, as viewed through a scanning electron microscope (SEM). Images courtesy of Tal Ellenbogen Kenneth Crozier, associate professor of electrical engineering …
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Improved copper wire bonding with non-contact metrology
… reliability. Until now, our industry has used the scanning electron microscope (SEM) to visualize these issues and thereby ..... in a stereoscopic implementation, and the scanning electron microscope (SEM). For optical microscopy, the pad …
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Bilayer graphene's "Higgs boson" insulating property
… spontaneous symmetry-breaking process. ( Higgs boson and graphene: Shared negative curvature ) Figure 2. A scanning electron microscope image of a graphene sheet (red) suspended between two electrodes. The length of the graphene sheet shown …
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AMAT debuts SEM for automatic 20nm defect inspection
December 5, 2011 -- Applied Materials, Inc. debuted its defect review scanning electron microscope (DR-SEM) Applied SEMVision G5 system to image and analyze 20nm yield-limiting defects in a production environment without …
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Semiconductor metrology beyond 22nm: FinFET metrology
… also critical process control variables. Some of the critical metrology steps entail critical dimension- scanning electron microscope (CD-SEM) measurements (resist and etch fin and gate CD and pitch; spacer width at the bottom; pre …
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SEM tweak enables crystal study of particles as small as 10nm
… Keller and Roy Geiss, have modified a standard scanning electron microscope (SEM) for a roughly 10-fold improvement ..... Transmission EBSD from 10 nm domains in a scanning electron microscope . Journal of Microscopy, 2011. doi: 10 …
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TESCAN combines nano-analysis tools in one platform
July 26, 2011 - BUSINESS WIRE -- TESCAN introduced the LYRA GM focused ion beam and scanning electron microscope (FIB--SEM) workstation, calling the system a multifunctional tool for nanotechnology . The tool integrates a FIB column and …
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Graphene doping doesn't need its own step when done on the edge
… interconnects, says James Meindl, director of Georgia Tech’s Nanotechnology Research Center. Image 1. This scanning electron microscope image shows contacts placed onto a graphene sheet. SOURCE: Kevin Brenner, GA Tech. “When we work with a three …
