Probe System
Probe System news and technical articles from Solid State Technology Magazine. Search Probe System latest and archived news and articles
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Robotic probe system aims to reduce semiconductor cleanroom space
… semiautomatic, or fully automatic mode, and removed from the cluster to be used as stand-alone probe systems. The Cluster Probe System automates multiple semiconductor test protocols in one tool, saving time and cleanroom real estate in the fab. Click …
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Cascade Microtech modular wafer probe system offers 6 measurement packages
Cascade Microtech introduced the modular MPS150 manual wafer probe station with six application-specific test packages for RF, mmW, and I-V/C-V measurement; failure analysis; and high-power device characterization.
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300-mm probe system
ES-220 Series automated systems, for cost-effective inspection of wafers and masks, can be configured to handle 300-mm wafers. Applications include inspection of patterned wafers before and after dicing, as well as chips in gel- or waffle-paks. As a metrology tool, the ES-220 can be used for ...
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SemiProbe patent for modular test system approved
Multiple configurations of the Probe System for Life. Manual Device Characterization ..... Patent and Trademark Office. The Probe System for Life allows the company and ..... For traditional test systems, Probe System for Life allows the user to configure …
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300-450mm manual wafer test probe configuration out from SemiProbe
… released a 300mm manual test probe configuration of its Probe System for Life, M-12. The M-12 is field-upgradable ..... map for export data to other systems downstream. The Probe System for Life (PS4L) universal test platform provides a …
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Solar-research-probe-from-SemiProbe
… SemiProbe has developed a new low-cost solar cell probe system for research applications. Built on the modular patented Probe System for Life (PS4L) platform, the system allows users …
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New Products
… 190, fax 49/77-3299-1911, e-mail info@blelab.de, www.blelab.de. Click here to enlarge image Laser probe system for flip chips The IDS 2500 is a high-precision timing measurement tool for design verification and failure analysis …
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On-wafe RFIC text capability
… test solution now features software that adds to the system: real-time wafer mapping, a binning summary, automated probe system control, and fixture calibration. The system also includes all necessary hardware for docking onto wafer-probe systems …
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Detection and elimination of a yield-critical non-visual residue defect
… induced charge. The inspection system used was the ChemetriQ system from Qcept Technologies. ChemetriQ is a scanning probe system that produces a full wafer image showing changes in the work function of the wafer. The resulting differential data …
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CSCD commissions curve tracers for on-wafer power device test
… resolution of 1pA. Cascade Microtech suggests power device testers use the curver tracers in combination with its Tesla probe system , which is says will shorten design cycles from traditional package-level device characterization methods that require …
