Probe System news and technical articles from Solid State Technology Magazine. Search Probe System latest and archived news and articles
semiautomatic, or fully automatic mode, and removed from the cluster to be used as stand-alone probe systems. The Cluster Probe System automates multiple semiconductor test protocols in one tool, saving time and cleanroom real estate in the fab. Click
Cascade Microtech introduced the modular MPS150 manual wafer probe station with six application-specific test packages for RF, mmW, and I-V/C-V measurement; failure analysis; and high-power device characterization.
ES-220 Series automated systems, for cost-effective inspection of wafers and masks, can be configured to handle 300-mm wafers. Applications include inspection of patterned wafers before and after dicing, as well as chips in gel- or waffle-paks. As a metrology tool, the ES-220 can be used for ...
Multiple configurations of the Probe System for Life. Manual Device Characterization ..... Patent and Trademark Office. The Probe System for Life allows the company and ..... For traditional test systems, Probe System for Life allows the user to configure
released a 300mm manual test probe configuration of its Probe System for Life, M-12. The M-12 is field-upgradable ..... map for export data to other systems downstream. The Probe System for Life (PS4L) universal test platform provides a
SemiProbe has developed a new low-cost solar cell probe system for research applications. Built on the modular patented Probe System for Life (PS4L) platform, the system allows users
190, fax 49/77-3299-1911, e-mail firstname.lastname@example.org, www.blelab.de. Click here to enlarge image Laser probe system for flip chips The IDS 2500 is a high-precision timing measurement tool for design verification and failure analysis
test solution now features software that adds to the system: real-time wafer mapping, a binning summary, automated probe system control, and fixture calibration. The system also includes all necessary hardware for docking onto wafer-probe systems
induced charge. The inspection system used was the ChemetriQ system from Qcept Technologies. ChemetriQ is a scanning probe system that produces a full wafer image showing changes in the work function of the wafer. The resulting differential data
resolution of 1pA. Cascade Microtech suggests power device testers use the curver tracers in combination with its Tesla probe system , which is says will shorten design cycles from traditional package-level device characterization methods that require