Home>Topics>Probe System

Probe System

Probe System news and technical articles from Solid State Technology Magazine. Search Probe System latest and archived news and articles

  1. 300-450mm manual wafer test probe configuration out from SemiProbe

    Article

    Wed, 22 Jun 2011

    released a 300mm manual test probe configuration of its Probe System for Life, M-12. The M-12 is field-upgradable ..... map for export data to other systems downstream. The Probe System for Life (PS4L) universal test platform provides a

  2. CSCD commissions curve tracers for on-wafer power device test

    Article

    Fri, 17 Jun 2011

    resolution of 1pA. Cascade Microtech suggests power device testers use the curver tracers in combination with its Tesla probe system , which is says will shorten design cycles from traditional package-level device characterization methods that require

© 2012. PennWell Corporation. All Rights Reserved. PRIVACY POLICY | TERMS AND CONDITIONS