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Micrograph

Micrograph news and technical articles from Solid State Technology Magazine. Search Micrograph latest and archived news and articles

  1. Tanner Labs now offers scanning electron micrograph (SEM) services in its MEMS R&D and fabrication facility

    Online Articles

    Thu, 11 Jan 2007

    PASADENA, CA -- Tanner Labs, a division of Tanner Research, today said it will begin offering scanning electron micrograph (SEM) services in its MEMS R&D and Fabrication Facility in Pasadena. Tanner has used the SEM system internally but is

  2. Current and future defectivity issues for equipment components and materials

    Magazine Articles

    Wed, 1 May 2013

    inspection, detection and failure analysis of sub 20 nm defect of substrate buried beneath deposition layers. (a) TEM micrograph of defect on substrate buried beneath deposition layers. (b) EDS in TEM determining compositional analysis. The NDC offers

  1. Advanced packaging technologies: Imbedding components for increased reliability

    Online Articles

    Tue, 27 Apr 2010

    cavity within a cavity). Figure 6. Micrograph SEM image (fisheye mode) of cavity ..... components and bond wires. Figure 7. Micrograph SEM image of cavity-within-a-cavity ..... adhesive interface. Figure 8. SEM micrograph of component-to-substrate interface

  2. HB-LED grade aluminum nitride meets thermal needs of today's LEDs

    Online Articles

    Fri, 24 Feb 2012

    60°C. This type of microstructure is shown in the SEM micrograph in Figure 4A. The dark grains in this figure, which are ..... microstructure will have a de-wetted Y-Al-O phase as shown in the micrograph in Figure 4B. Figure 5. Microstructure sintered at 1675C

  3. Conference report: IITC closes with talks from EUV to TSV

    Online Articles

    Thu, 7 Jun 2012

    layer has been designed into the M8 dielectric (shown) that carries no real estate cost. Figure 4. Transmission electron micrograph of Via-8, showing a MIM capacitor embedded in silicon nitride and sidewall connections to the electrode. SOURCE: GLOBALFOUNDRIES

  4. Real-time monitoring slashes water and energy usage in semiconductor manufacturing on 300mm and 450mm wafers

    Online Articles

    Mon, 23 Jul 2012

    water and chemical usage during surface preparation for silicon wafers. Highly sensitive sensors, like those shown in this micrograph of a sensing channel, can reduce the amount of resources needed for the cleaning of surfaces. Surface preparation , when

  5. Molybdenum sulfide: the new graphene?

    Online Articles

    Thu, 20 Sep 2012

    mechanical flexibility. The lattice structure of MoS. A schematic of the CVD process for growing single-layer MoS. An optical micrograph of single-layer MoS sheets grown by this process, showing great uniformity and coverage.

  6. High-k metal gate characterization using picosecond ultrasonic technology

    Online Articles

    Tue, 1 Mar 2011

    is ~ 0.3% or less. Figure 3 shows a cross-section TEM micrograph of a 60Å TiN stack and a 49-point line scan profiles across ..... capability of the technique. Figure 3. Cross-section TEM micrograph of TiN barrier metal and 49-point line scans across the

  7. SuVolta's DDC transistor technology @ IEDM

    Online Articles

    Thu, 8 Dec 2011

    transistor on Fujitsu Semiconductor's low-power CMOS process is shown in Figure 1. The cross sectional transmission electron micrograph (TEM) shows the transistor fabricated on a planar bulk silicon structure. Figure 1. SuVolta's cross-section TEM The

  8. NEMS sensor improves AFM

    Online Articles

    Fri, 3 Jun 2011

    instrumentation with a nanomechanical cantilever probe and nanophotonic interferometer on a chip. Figure. Scanning electron micrograph (SEM) of the cantilever-microdisksystem. A calculated z-component of the magnetic field is overlaid on the structure

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