Metrology Tool
Metrology Tool news and technical articles from Solid State Technology Magazine. Search Metrology Tool latest and archived news and articles
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Major semiconductor makers order EUV lithography metrology tool from Carl Zeiss
… optics department of Carl Zeiss SMT, Lithography Optics (LIT), and external partners. Kienzle notes that the metrology tool wins “confirm the relevance of EUV technology for the industry.” Metrology tools for EUVL are an industry need …
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Tamar Technology debuts TSV metrology tool WaferScan
October 4, 2011 -- Tamar Technology, precision metrology tool supplier, shipped its first fully automated WaferScan ..... based measurements, such as hole diameter. The metrology tool uses optical and non-destructive methods, measuring …
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MEMS wafers characterized by Zebraoptical integrated metrology tool
… microscope attachment. The Zebraoptical Integrated Metrology Tool (ZIMT) provides metrology readings on micro electromechanical ..... www.zebraoptical.com . Zebraoptical Integrated Metrology Tool (ZIMT) interferometry measurement. Follow Small …
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Metrology tool offers economical price point with high accuracy
Hexagon Metrology released the Optiv Classic 321GL tp benchtop vision-measuring metrology system for the North American market. It suits electronics and precision parts inspection, including micro-holes, fiber optics, filters, and more.
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Confovis taps Digital Surf for metrology tool imaging software
Confovis will begin providing MountainsMap imaging and surface analysis software from Digital Surf with its ConfoCAM LED grid-confocal measuring systems for inspection and research.
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Rudolph sells metrology tool for back-end wafer packaging processes
Rudolph Technologies (NASDAQ:RTEC) delivered the first MetaPULSE metrology system to measure under bump metallization (UBM) and redistribution layers (RDL) in advanced package manufacturing.
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LayTec in-line metrology tool inspects CIGS, CdTe at production speeds
LayTec will unveil the in-line metrology system PearL at Intersolar Europe 2011. The optical in-line monitoring system measures photoluminescence spectra of CIGS thin-film modules in production lines, and a product option for CdTe absorbers is also available.
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Semiconductor foundry integrates Nova metrology for CMP at various nodes
April 4, 2012 - PRNewswire -- Metrology tool supplier Nova Measuring Instruments Ltd. (NASDAQ:NVMI) will provide the production tools of record (PTOR) performing chemical …
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EUV lithography readiness: ConFab presentation preview
… SEMATECH in the late 1990s to the International 300 mm Initiative (I300I), where he was responsible for 300 mm metrology tool equipment demonstrations. Prior to his previous assignment as associate director of lithography at SEMATECH, he …
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Lithography challenges for leading edge 3D packaging applications
… Both single pass and double pass methods create overlay structures at the surface which can then be measured by a metrology tool or measured on the stepper using SSM. The SSM method was specifically designed to perform stepper-to-itself overlay …
