Metrology Equipment news and technical articles from Solid State Technology Magazine. Search Metrology Equipment latest and archived news and articles
has released a new software development kit for metrology equipment manufacturers. WAFERMAP-View.OCX for Win95 ..... satisfy the analysis and visualization needs of metrology equipment manufacturers. WAFERMAP-View.OCX allows software
Tektronix donated semiconductor test and measurement equipment to Washington State University Vancouver: arbitrary/function generations, a real-time spectrum analyzer, digital phosphor and mixed signal oscilloscopes, Keithley's semiconductor parameter analyzers, and Fluke's True-rms multimeters.
enabling integration of metrology equipment and processing equipment ..... tools, such as furnaces, and metrology equipment . After the layers are deposited ..... roadmap for integration of the metrology equipment in the furnace. Currently
James Montgomery, News Editor Chris Moore, CEO of metrology equipment supplier Philips AMS (now known simply as AMS ..... announced the sale of its majority ownership in metrology equipment unit Philips AMS to JHW Greentree Capital, an
March 2, 2007 - Israel metrology equipment provider Nova Measuring Instruments Ltd. says it has agreed to a $5 million private placement of nearly 2 million shares by a
March 21, 2007 - Nearly one year to the day after acquiring overlay metrology firm Soluris Inc. , metrology equipment supplier Nanometrics Inc. says it is closing the firm's Concord, MA facility and consolidating all of its overlay metrology
Semiconductor manufacturers are increasingly trying to cut expenses and spending, and the first casualty appears to be metrology equipment investments, according to a new report from The Information Network. Semiconductor yields have reached a point
Jan. 7, 2008 - Metrology equipment supplier Metryx Ltd. and IMEC have formed a joint development program centering on evaluating and developing mass metrology at
August 7, 2007 -- Nanometrics Inc. , supplier of advanced metrology equipment to the semiconductor industry, says that Timothy J. Stultz, Ph.D. will join the company as its president and chief executive
Device fabrication at the sub-90nm technology node mandates that integrated metrology equipment measure complex structures and new materials directly on virtually every patterned production wafer, without sacrificing throughput