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Mask Manufacturers

Mask Manufacturers news and technical articles from Solid State Technology Magazine. Search Mask Manufacturers latest and archived news and articles

  1. 22nm brings maskmakers, end users closer

    Online Articles

    Tue, 11 Jan 2011

    January 11, 2011 - For mask manufacturers , the conditions and challenges ..... carry technical challenges for mask manufacturers . SMO brings pattern complexity ..... significant overlay challenge, mask manufacturers have successfully produced

  2. Photomask for wafer fab: A look at the industry's structure

    Online Articles

    Fri, 17 Sep 2010

    The 5 competitive forces for mask manufacturers Competitive force Threat to ..... forces for captive and merchant mask manufacturers is given in the attached chart ..... supplier. However, captive mask manufacturers are owned by companies that

  1. Merging mask design and manufacturing to drive cycle-time improvement

    Magazine Articles

    Fri, 1 Jun 2007

    should resemble the mask). Mask manufacturers performed data sizing to correct ..... cost and cycle time. Neither mask manufacturers nor chip designers needed to ..... data optimization from the mask manufacturers . Extending into the 90nm technology

  2. Mask and template inspection: Production-worthy mask inspection for emerging nodes

    Online Articles

    Wed, 18 Aug 2010

    inspection needs: blank and patterned-mask development, production, and outgoing quality control (OQC) for mask manufacturers , and incoming quality control (IQC) and reticle re-qualification in the IC fab. But EUV actinic inspection

  3. 22nm Challenges Abound for 2011

    Online Articles

    Sat, 1 Jan 2011

    extremely difficult to deploy in mass production. Franklin Kalk, CTO, Toppan Photomasks Inc., adds that, for mask manufacturers , the conditions and challenges at the 22nm (32nm half-pitch) technology node are becoming clear. "Immersion

  4. Carl-Zeiss-Synopsys-collaborate-in-die-registration-metrology-photomask manufacturing

    Online Articles

    Thu, 28 Oct 2010

    Zeiss SMS GmbH. Registration errors can now be quantified for each mask with no resolution limitations, giving mask manufacturers a completely new tool for reducing placement errors in double patterning and mask-to-mask overlay. For more

  5. The ultimate solution for 193nm reticle haze?

    Magazine Articles

    Thu, 1 Nov 2007

    special steps are taken to convert it back to the ‘dehydrated’ form. Those steps are not currently employed by mask manufacturers . Similarly, the chromium surface in sub-pellicle space also is chemically modified. Chemical analysis of the

  6. Next–Generation Lithography: EUVL readiness for pilot line insertion

    Magazine Articles

    Sun, 1 Feb 2009

    with essentially no defects. These inspection tools must also map the locations of any remaining defects so that mask manufacturers can subsequently use defect mitigation methods to obscure those defects that could print during exposure. To verify

  7. Single-pass die-to-database tritone reticle inspection

    Magazine Articles

    Tue, 1 May 2007

    are needed to manage two IRs associated with the dual-pass inspection strategy for a single tritone reticle. Mask manufacturers would need to pay special attention to ensure that both sets of IR coordinates are provided to defect repair tools

  8. Mask rule standards: A baby step for DfM

    Magazine Articles

    Mon, 1 May 2006

    the reticle manufacturing process in order to meet cycle time, quality, and cost requirements at a given node. Mask manufacturers do this by working through the key steps in the process for manufacturing the highly detailed mask structures created

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