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Interconnect Applications

Interconnect Applications news and technical articles from Solid State Technology Magazine. Search Interconnect Applications latest and archived news and articles

  1. Novellus tips WN film for 3X memory Cu interconnects

    Magazine Articles

    Tue, 1 Jun 2010

    Novellus says it has devised a new process technology for tungsten vias for copper interconnect applications in 3X node and below memory devices. The "DirectFill" chemical vapor deposition (CVD) tungsten nitride (WN) liner-barrier

  2. Optomec aerosol jet printing featured as wire bond, TSV alternative at IMAPS Device Packaging

    Online Articles

    Tue, 8 Mar 2011

    will give a presentation titled "Aerosol Jet Printing as an Alternative to Wire Bond and TSV Technology for 3D Interconnect Applications " at the IMAPS (International Microelectronics and Packaging Society) Device Packaging Conference on March

  1. Optimized bath control for void-free copper deposition

    Magazine Articles

    Thu, 1 Nov 2001

    plating bath for copper interconnect applications is achieved by careful ..... filling in advanced Cu interconnect applications [1, 2]. Organic additives ..... plating bath for copper interconnect applications is achieved by careful

  2. More SEMICON West exhibit previews

    Online Articles

    Sun, 8 Jul 2012

    Jet system can be used to produce high-conductivity adhesive features for surface mount and high-stress interconnect applications . Aerosol Jet technology can print a wide variety of electronic materials directly onto a wide variety on non

  3. Novellus tips WN film for ≤3X memory Cu interconnects

    Online Articles

    Mon, 10 May 2010

    May 10, 2010 - Novellus says it has devised a new process technology for tungsten vias for copper interconnect applications in 3X node and below memory devices . The "DirectFill" chemical vapor deposition (CVD) tungsten nitride

  4. FEI eyes 3D structures with integrated SEM/FIB platform

    Magazine Articles

    Tue, 1 Jun 2010

    materials science R&D. Figure 1. TSV and interconnect applications . (Source: FEI Co.) Key to the system ..... coincident WD. Through-silicon vias (TSV) and interconnect applications are challenging because of the increased milling

  5. Electromigration improvement for advanced technology nodes

    Online Articles

    Mon, 4 Jan 2010

    On the Use of Alloying Elements for Cu Interconnect Applications ," J. Vac. Sci. Technol. B , Vol. 24 ..... Wu, et al., "Ti-based Barrier for Cu Interconnect Applications ," Proc. of the IITC , p. 202, 2008

  6. MRS Day 4: TSVs and CMOS+MEMS, wafer bonding, CNT interfaces, ALD for rare-earth HK, graphene redux

    Online Articles

    Mon, 19 Apr 2010

    and DC testing modes. F10.4 . Bin Yu at Albany CNSE investigated some key reliability limits for on-chip interconnect applications of multilayer graphene systems. The mobility of graphene is 20× higher than Si and its thermal conductivity

  7. FEI eyes 3D structures with integrated SEM/FIB platform

    Online Articles

    Wed, 28 Apr 2010

    their surface sensitivity. Figure 1. TSV and interconnect applications . (Source: FEI Co.) The XHR SEM imaging ..... coincident WD. Through-silicon vias (TSV) and interconnect applications are challenging because of the increased milling

  8. Implications of damascene topography for electroplated copper interconnects

    Online Articles

    Sun, 1 Aug 1999

    advantageous for submicron interconnect applications . In the absence of additives ..... of electroplating for interconnect applications [2, 3]. Cross-section ..... The plating baths for interconnect applications currently include a combination

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