Inspection System
Inspection System news and technical articles from Solid State Technology Magazine. Search Inspection System latest and archived news and articles
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Rudolph wins TSV inspection systems order
… Wafer Scanner 3880 3D Inspection System , multiple NSX Macro Defect Inspection Systems and its Discover Yield ..... the Wafer Scanner Inspection System provides superior ..... one micron. The NSX Inspection System family is the market …
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Rudolph: NSX package inspection system sales top 1000
… Technologies Inc. (NASDAQ:RTEC) shipped the 1000 th NSX Inspection System from its Bloomington, MN manufacturing facility. The ..... current Rudolph employee, says that the automated macro inspection systems had to perform to meet customer expectations, and move …
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KLAC targets 28nm and below with Surfscan SP3 inspection systems
… its Surfscan family of wafer defect and surface quality inspection systems : the Surfscan SP3. The unpatterned wafer inspection platform ..... of the difficulties in making a more sensitive defect inspection system is that the signal required to detect such a small defect …
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Moritex upgrades MEMS inspection system
… Macro Micro IR Vision System infrared (IR) transmission inspection system for micro electromechanical systems (MEMS) and semiconductor ..... supports cassette-to-cassette (C to C) systems. The inspection system can be used to detect defects on hermetic bonding interfaces …
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KLA-Tencor uncrates metrology line-up for leading-edge semiconductor wafers
… wafer defect inspection systems : the 2900 ..... wafer defect inspection system combines ..... wafer defect inspection systems provide improved ..... e-beam inspection systems feature leading ..... e-beam inspection system , allowing …
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New Products
… Tencor Corp. launched three semiconductor wafer defect inspection systems : the 2900, Puma 9650, and eS800 series. The product ..... The Puma 9650 Series narrowband optical wafer defect inspection system combines reported sensitivity and throughput in multi …
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KLAC debuts 20nm-node defect inspection system
KLA-Tencor Corporation (NASDAQ:KLAC) launched the eDR-7000 electron-beam (e-beam) wafer defect review system for chip manufacturing at the 20nm device nodes and below.
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LED inspection unit launches Altatech Semiconductor's LEDs line
December 14, 2011 -- Altatech Semiconductor S.A. launched its first LED inspection system , the non-contact AltaSight LEDMax, for detecting, classifying and characterizing defects on wafers used in manufacturing light …
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Rudolph launches TSV inspection tool, wins first order
… Inc. (NASDAQ: RTEC), process characterization equipment and software provider, debuted the NSX 320 Automated Macro Inspection System for through silicon vias (TSV) and other advanced package process inspection , edge trimming metrology, wafer alignment …
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OSAT provider orders wafer inspection tools from Camtek
… Deliveries will take place during the current and next two quarters. Camtek's Falcon line of automated wafer inspection systems are used by semiconductor manufacturers, bumping houses, and packaging foundries for defect detection and metrology …
