Focused Ion Beam
Focused Ion Beam news and technical articles from Solid State Technology Magazine. Search Focused Ion Beam latest and archived news and articles
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Camtek launches TEM for advanced semiconductor makers
… sample preparation system for the semiconductor industry. Camtek calls the system an alternative to traditional focused ion beam (FIB) analysis. Camtek has received its first purchase order for the tool, from a leading semiconductor company …
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Semiconductor metrology beyond 22nm: FinFET metrology
… Advisory Group (AMAG). Aaron Cordes is a research engineer for Sematech in Albany doing work on AFM, TEM, and focused ion beam metrology. He is also a PhD student with SUNY Albany’s College of Nanoscale Science and Engineering. Victor …
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MEMS packaging and test project aims for space
… the Technical Research Centre of Finland, will join the project consortium; negotiations are currently under way. Focused ion beam (FIB) tool at Fraunhofer. Increased reliability via improved packaging could extend MEMS lifetimes and make them …
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Semiconductor metrology beyond 22nm: Defect inspection and review
… technologies and testing novel methods such as plasma focused ion beam (FIB) and laser-based milling. SEMATECH is also working in cooperation ..... for Sematech in Albany doing work on AFM, TEM, and focused ion beam metrology. He is also a PhD student with SUNY Albany …
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NIST: Cold atoms could replace hot gallium in focused ion beams
… NIST team took a different approach to generating a focused ion beam that opens up the possibility for use of non-contaminating ..... can achieve the brightness and intensity to work as a focused ion beam "nano-scalpel." The same technique, says McClelland …
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PRODUCT NEWS
… throughput SEM/FIB combines focused ion beam micro-milling with the high ..... 4000, www.coherent.com. Focused ion beam system Click here to enlarge image The OptiFIB-IV focused ion - beam (FIB) system is the latest generation …
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FEI eyes 3D structures with integrated SEM/FIB platform
… the company's extreme high-resolution scanning electron microscope (XHR SEM) with a new, high-performance focused ion beam (FIB). Applications for the new system include failure analysis, 3D nanoscale characterization, prototyping …
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FEI joins SEMATECH metrology R&D program
… capabilities of transmission electron microscopy (TEM) analysis, with electron energy loss spectroscopy (EELS) and focused ion beam (FIB) technology to address critical needs in process development and defect analysis. These tools will provide …
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MIT adds TESCAN SEM for nano MEMS microfluidics studies
March 8, 2011 - BUSINESS WIRE -- TESCAN, scanning electron microscope and focused ion beam workstation maker, delivered a VEGA 3 scanning electron microscope (SEM) to the Massachusetts Institute of Technology (MIT …
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Nanocomposites in nature fuel OPV flex electronics
… Madison, WI. The researchers extracted micron-sized samples from the leading edge of the chiton tooth. Using a focused ion beam (FIB) tool at the Northwestern University Atomic and Nanoscale Characterization Experimental Center core facility …
