Focused Ion Beam
Focused Ion Beam news and technical articles from Solid State Technology Magazine. Search Focused Ion Beam latest and archived news and articles
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TESCAN combines nano-analysis tools in one platform
… 2011 - BUSINESS WIRE -- TESCAN introduced the LYRA GM focused ion beam and scanning electron microscope (FIB--SEM) workstation ..... instrumentation, such as Electron Microscopes and Focused Ion Beam workstations. Learn more at www.tescan.com
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Conference Report: MRS Spring 2012, Day 4
… to take it to $0.01/kWh in 3-5 years. II11.4 Daniel Collins of U Victoria (Canada) walked us through a focused ion beam (FIB) method for fabricating 2D and 3D graphene junctions with graphite that is non-destructive to the extremely …
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Evolution or revolution: the path for metrology beyond the 22nm node
… technologies and testing novel methods such as plasma focused ion beam (FIB) and laser-based milling. SEMATECH is also ..... for Sematech in Albany doing work on AFM, TEM, and focused ion beam metrology. He is also a PhD student with SUNY Albany …
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New Products
… sample preparation system for the semiconductor industry. Camtek calls the system an alternative to traditional focused ion beam (FIB) analysis. TEM enables analysis of small semiconductor feature dimensions and complex materials. The Xact200 …
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Semiconductor metrology beyond 22nm: 3D memory metrology
… Advisory Group (AMAG). Aaron Cordes is a research engineer for Sematech in Albany doing work on AFM, TEM, and focused ion beam metrology. He is also a PhD student with SUNY Albany’s College of Nanoscale Science and Engineering. Victor …
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Semiconductor metrology beyond 22nm: FinFET metrology
… Advisory Group (AMAG). Aaron Cordes is a research engineer for Sematech in Albany doing work on AFM, TEM, and focused ion beam metrology. He is also a PhD student with SUNY Albany’s College of Nanoscale Science and Engineering. Victor …
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Camtek launches TEM for advanced semiconductor makers
… sample preparation system for the semiconductor industry. Camtek calls the system an alternative to traditional focused ion beam (FIB) analysis. Camtek has received its first purchase order for the tool, from a leading semiconductor company …
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Semiconductor metrology beyond 22nm: Defect inspection and review
… technologies and testing novel methods such as plasma focused ion beam (FIB) and laser-based milling. SEMATECH is also working in cooperation ..... for Sematech in Albany doing work on AFM, TEM, and focused ion beam metrology. He is also a PhD student with SUNY Albany …
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FEI plasma FIB tool suits MEMS, 3D packaging
By Debra Vogler, senior technical editor June 13, 2011 -- FEI launched its Vion plasma focused ion beam (PFIB) system based on inductively-coupled plasma (ICP) source technology using a xenon ion beam. The system generates more …
