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Extreme Ultraviolet Lithography

Extreme Ultraviolet Lithography news and technical articles from Solid State Technology Magazine. Search Extreme Ultraviolet Lithography latest and archived news and articles

  1. EUV lithography readiness: ConFab presentation preview

    Article

    Mon, 21 May 2012

    An Steegan, IMEC; Thomas Jefferson, G450 Consortium; and Naoya Hayashi, Dai Nippon Printing Co. Ltd. Extreme ultraviolet lithography (EUVL) has been in development for about a quarter century and is now getting ready for prime time with

  2. Ion beam optimization to reduce EUV mask blank defects

    Article

    Fri, 4 May 2012

    beam missing the target of the mask blank deposition system. This analysis provides a possible solution. Extreme ultraviolet lithography (EUVL) is currently scheduled for high volume manufacturing starting in 2015. One of the top remaining

  1. Major semiconductor makers order EUV lithography metrology tool from Carl Zeiss

    Article

    Wed, 25 Apr 2012

    April 25, 2012 -- Carl Zeiss Semiconductor Metrology Systems (SMS) Division won orders for its extreme ultraviolet lithography (EUVL) actinic aerial image metrology system, AIMS EUV, from 2 of the 4 members of SEMATECH’s EMI

  2. SEMICON West heralds 22nm, EUVL, 450mm, mobile electronics speakers

    Article

    Mon, 2 Apr 2012

    development efforts will be discussed in the July 11,10:30am, South Hall TechXPOT session. Learn about extreme ultraviolet lithography (EUVL) readiness from transmission and conversion efficiency to mask and resist work. The session will

  3. Tackling EUV lithography shadow distortions with OPC

    Article

    Thu, 2 Feb 2012

    February 2, 2012 -- Extreme ultraviolet lithography (EUVL) is a leading option for semiconductor technology scaling below 22nm. EUVL adoption depends not only on the instrumentation

  4. EUV OPC flow optimization for volume manufacturing

    Print

    Thu, 1 Sep 2011

    et al., "Flare mitigation strategies in extreme ultraviolet lithography ," Microelectronic Eng. Vol. 85, Issues ..... 2010. [6] G. F. Lorusso, et al., " Extreme ultraviolet lithography at IMEC: Shadowing compensation and flare

  5. SUSS EUV lithography mask management system debuts with imec install

    Article

    Wed, 13 Jul 2011

    July 13, 2011 -- SUSS MicroTec unveiled MaskTrack Pro InSync, a holistic in-fab extreme ultraviolet lithography (EUVL) mask management product that synchronizes mask cleaning, handling, inspection, and storage. The tasks are performed

  6. Improving line roughness by using EUV assist layers

    Print

    Thu, 1 Sep 2011

    A. Yu, et al., "Patterning of tailored polycarbonate based non-chemically amplified resists using extreme ultraviolet lithography ," Macromolecular Rapid Comm., 31, pp. 1449-1455 (2010). F.V. Roey, et al., imec: internal

  7. SEMICON West 2011: New product roundup

    Article

    Wed, 27 Jul 2011

    swiveling articulation on the mounting end. Suss MicroTec The MaskTrack Pro InSync is a holistic in-fab extreme ultraviolet lithography (EUVL) mask management product that synchronizes mask cleaning, handling, inspection, and storage

  8. Ushio achieves 30W EUV lithography output

    Article

    Mon, 31 Oct 2011

    a presentation in an international conference for EUV lithography -- the 2011 International Symposia on Extreme Ultraviolet Lithography and Lithography Extensions -- held in Miami, FL in late October. Also read: EUV Symposium report card

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