Electron Microscope
Electron Microscope news and technical articles from Solid State Technology Magazine. Search Electron Microscope latest and archived news and articles
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Electron microscope project SALVE enters Phase 2
… evaluation and are starting the second phase of the Sub Angstrom Low Voltage Electron Microscope (SALVE) project. SALVE aims to create a transmission electron microscope (TEM) capable of imaging samples with atomic resolution at very low acceleration …
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TESCAN combines nano-analysis tools in one platform
… introduced the LYRA GM focused ion beam and scanning electron microscope (FIB--SEM) workstation, calling the system a multifunctional ..... demonstrated. TESCAN makes scientific instrumentation, such as Electron Microscopes and Focused Ion Beam workstations. Learn more at www …
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Nano-scale gratings stabilize VCSEL polarization
April 15, 2011 -- Electron microscopes use focused electron beams to make extremely small objects visible. By combining the microscope with a gas-injection system …
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FEI intros S/TEM with Sandia Labs order
… released the Titan G2 80-200 scanning/transmission electron microscope (S/TEM) with ChemiSTEM Technology and accelerating ..... resolution improvements over its existing FEG analytical electron microscope . Sandia will use the microscope for atomic resolution …
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Electron beam could assemble nanoscale objects
… National Institute of Standards and Technology (NIST) and the University of Virginia (UVA) have demonstrated that electron microscope beams can be used to move around nanoscale objects, raising the possibility of positioning and assembling nanoelectronics …
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Advantest to expand beyond semiconductor test
… structure. Outside of semiconductor test products, Advantest will bring its measurement technologies into scanning electron microscopes (SEM), electron beam (e-beam) lithography, RF measurement devices, MEMS switches, terahertz analysis …
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Nanoimprinted anti-reflective plastics improve viewing angle on next-gen displays
… with less glare on televisions, and larger light-absorption areas on organic solar cells. Figure. Scanning electron microscope (SEM) image showing the engineered anti-reflective nanostructures (left) that mimic structures found in …
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Ion beam optimization to reduce EUV mask blank defects
… imaging, and the chemical analysis was performed using energy dispersive X-ray mapping by a scanning transmission electron microscope (STEM-EDS). The defect, which clearly contains iron and chrome, reached the substrate during the deposition …
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SEM tweak enables crystal study of particles as small as 10nm
… Keller and Roy Geiss, have modified a standard scanning electron microscope (SEM) for a roughly 10-fold improvement in measuring ..... Geiss. Transmission EBSD from 10 nm domains in a scanning electron microscope . Journal of Microscopy, 2011. doi: 10.1111/j …
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Evolution or revolution: the path for metrology beyond the 22nm node
… critical process control variables. Some of the critical metrology steps entail critical dimension-scanning electron microscope (CD-SEM) measurements (resist and etch fin and gate CD and pitch; spacer width at the bottom; pre- and …
