DUT
DUT news and technical articles from Solid State Technology Magazine. Search DUT latest and archived news and articles
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Audio Precision uncrates PDM interface for MEMS microphone test
… interpolation ratio will be available in Summer 2012. The PDM option includes a built-in power supply for devices under test ( DUT ), and can directly measure power supply rejection (PSR) in PDM devices. Users must have APx500 v3.0 software, which may …
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Keithley power semiconductor tester uses 3000V source
… The test tool sources up to 5x power to the device under test ( DUT ) than competitive systems, Keithley asserts. The Model 2657A ..... thermal probe ports to simplify system integration for further DUT characterization. The Model 8010 has full safety interlock capability …
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Multitest delivers MEMS testing for pick-and-place set ups
… This setup leverages Multitest’s long-term MEMS test expertise as well as thorough understanding of the challenges in DUT handling. Thus, the industry-leading positioning accuracy and tri-temp performance of the MT9510 also is now available …
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Multitest launches MT9510 x16 test tool with Asian sale
… site in Asia. Based on the MT95XX platform technology, the MT9510 x16 performs temperature testing and device under test ( DUT ) handling for high parallel test from -55 to +175°C. RF and Kelvin testing are fully supported. The 16-site version …
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Multitest ships first MEMS MT9510 test tool to US IDM
… This new combination is based on the MT MEMS and MT9510 platforms, combining expertise in MEMS test and device under test ( DUT ) handling. The MT9510 offers positioning accuracy and tri-temp performance for MEMS test. Multitest has delivered MEMS test …
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Flip chip probe card from Wentworth Laboratories withstands high-power, high-density test
… interface board (PIB). This integrated direct dock design is said to improve electrical contact from tester to device under test ( DUT ). It uses the company's SaberProbe contacts to avoid contact fusing under high current/density. Users can remove and insert …
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Cascade Microtech's WinCalXE integrates SussCal for better on-wafer VNA measurements
… January 2010 for $98 million . The test systems business specializes in wafer-level test solutions for devices under test ( DUT ). WinCalXE 4.5 is used with a vector network analyzer to make on-wafer high-frequency measurements. WinCalXE 4.5 S …
