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Automated Inspection

Automated Inspection news and technical articles from Solid State Technology Magazine. Search Automated Inspection latest and archived news and articles

  1. Automated inspection improves yield, reduces manufacturing cost of 3DICs

    Magazine Articles

    Mon, 1 Feb 2010

    York, to develop standards and best practices for automated inspection for the next generation 3DIC and TSV processes ..... there are many well-established technologies for automated inspection of the front-side of the wafer, inspecting the

  2. August Technology unveils tool for automated inspection of 300mm wafers

    Online Articles

    Mon, 18 Dec 2000

    a supplier of inspection solutions to the microelectronics industry, today introduced a complete solution for automated inspection of 300mm wafers designed to meet the unique and challenging needs of 300mm processing. The tool is built on the

  1. August Installs 500th Automated Inspection System

    Online Articles

    Fri, 8 Jul 2005

    (July 8, 2005) Minneapolis, Minn. — August Technology Corp. has installed its 500th NSX Series automated defect inspection system. First introduced in 1997, the NSX Series detects defects greater than 0.5 µm, and also performs advanced macro inspection.

  2. Camtek Focuses on Intelligent Automated Inspection

    Online Articles

    Mon, 11 Dec 2006

    (December 11, 2006) MIGDAL HA'EMEK, Israel Camtek Ltd. introduced the Pegasus 200S automated optical inspection (AOI) system to evaluate finished high-density interconnect substrates (HDI-S). The model is expected to automate traditionally manual quality-assurance inspection, said Yankee Yavor,

  3. Automated Inspection system

    Magazine Articles

    Tue, 1 Jul 1997

    Automated inspection system Model 890 automatically inspects wafers and die, and performs package substrate bump inspection. Featuring a very high

  4. Automated inspection of OPC and PSM masks

    Magazine Articles

    Tue, 1 Jul 1997

    Automated inspection of OPC and PSM masks Wolfgang Staud, Karen Huang, Patricia Beard, Photronics Inc., Milpitas, CaliforniaYair Eran, Applied

  5. KLA-Tencor debuts LED substrate epi-wafer inspection system

    Online Articles

    Mon, 24 Jan 2011

    NASDAQ: KLAC) debuted an automated inspection system for substrates and ..... manual inspection vs. automated inspection ). SOURCE: KLA-Tencor ..... Burkeen also explained how automated inspection results in higher defect

  6. Substrate/epi wafer inspection for LEDs: Excursion sensitivity matters

    Magazine Articles

    Tue, 1 Mar 2011

    KLA-Tencor has debuted an automated inspection system for substrates and ..... manual inspection vs. automated inspection . (Source: KLA-Tencor ..... Burkeen also explained how automated inspection results in higher defect

  7. Bright field-bright future:Material defect detection with a laser scanning system

    Magazine Articles

    Mon, 1 Sep 1997

    could not be detected by automated inspection systems - known generically ..... process are performed on automated inspection systems and the remainder ..... becomes increasingly critical. Automated inspection . Decreasing dimensions of

  8. Wafer Inspection Tool

    Online Articles

    Tue, 22 Jan 2008

    Suited to inspection of MEMS devices, the AW200 Series C-SAM acoustic micro imaging system from Sonoscan performs automated inspection , analysis and sorting of bonded wafers up to 200-mm in diameter. To avoid immersing the bonded wafer pair in

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