More Semiconductor Metrology Articles

North American semiconductor tool makers see higher bookings in April

May 23, 2012

North America-based manufacturers of semiconductor fab equipment posted $1.60 billion in orders and $1.45 billion in billings in April 2012 for a book-to-bill ratio of 1.10, according to SEMI.

SUSS MicroTec takes over SUSS MicroOptics

May 15, 2012

SÜSS MicroTec AG has increased its shareholding in SUSS MicroOptics S.A. to 100%. SUSS MicroOptics is a leading company for high-quality refractive and diffractive micro-optics.

Advantest DRAM test system clocks 8Gbps test speed on every pin

May 14, 2012

Advantest Corporation uncrated the next-generation high-speed DRAM test system, T5511, offering 8Gbps test speed. It can be deployed from R&D through to volume production.

UNL taps SEMI-GAS for semiconductor metrology lab’s gas needs

May 8, 2012

SEMI-GAS Systems, ultra-high-purity gas source and distribution system maker, will outfit the University of Nebraska - Lincoln’s new Nanoscience Metrology Facility. Applied Energy Systems will provide field services.

President Obama speaks at Albany Nano-Tech Complex today

May 8, 2012

President Barack Obama toured the SUNY - Albany Nano-Tech Complex today, speaking about the economy and education in the CNSE NanoFab Extension Building.

Camtek ships semiconductor inspection tools to leading US IDM

May 7, 2012

A leading, US-based IDM ordered about $5 million of front- and back-end semiconductor automatic optical inspection (AOI) tools from Camtek Ltd.

CEA-Leti unveils wide-reaching silicon research scope

May 2, 2012

CEA-Leti has introduced the “LETI-3S” concept, for “Silicon Specialty Solutions.” The research is oriented to start-ups, component integrators, fabless or fablite chip companies, and equipment/consumable suppliers.

Become the Best of West at SEMICON West

May 1, 2012

Solid State Technology and SEMI will present the 2012 Best of West product awards at SEMICON West 2012, July 10-12 in San Francisco. Best of West recognizes important product and technology developments in the microelectronics industries.

A fresh perspective on 450mm

May 1, 2012

I recently had the good fortune to moderate the SEMI Northeast Forum on 450mm in Albany.

What have we done for you lately?

May 1, 2012 This page is usually reserved for a guest editorial by someone in the industry that wants to rant a little bit about the lack of standards in any given area, the need to get young students interested in engineering and the sciences, why fab safety is so important, or answering the call to innovat...

Major semiconductor makers order EUV lithography metrology tool from Carl Zeiss

Apr 25, 2012

Carl Zeiss won orders for its EUVL actinic aerial image metrology system, AIMS EUV, from 2 of the 4 members of SEMATECH’s EMI partnership. The tool allows chip makers to review defects in advanced masks needed for EUVL.

KLA-Tencor wafer defect/metrology cluster tool monitors all wafer surfaces in parallel

Apr 23, 2012

KLA-Tencor Corporation (NASDAQ:KLAC) debuted the CIRCL suite high-throughput defect inspection/metrology/review system for implementation at lithography, outgoing quality control (OQC) and other process modules in semiconductor manufacturing lines.

Metrology tool offers economical price point with high accuracy

Apr 23, 2012

Hexagon Metrology released the Optiv Classic 321GL tp benchtop vision-measuring metrology system for the North American market. It suits electronics and precision parts inspection, including micro-holes, fiber optics, filters, and more.

Semiconductor subsystems see record revenues thanks to 32nm and below

Apr 23, 2012

Strong lithography spending, as well as several acquisitions and divestures in the space, brought changes to the critical subsystems of semiconductor/related markets sector, says VLSIresearch. 

North American semiconductor fab tool makers see March book-to-bill hike

Apr 20, 2012

With a book-to-bill ratio of 1.13, North America-based manufacturers of semiconductor equipment saw a sixth climb in the ratio, which has steadily improved since it hit 0.71 in September 2011, shows SEMI.

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