IRPS set for April in Anaheim
02/21/2012
The IEEE International Reliability Physics Symposium (IRPS) is set for April 15, 2012 – April 19, 2012, in Anaheim, CA. |
Semiconductor metrology beyond 22nm: 3D memory metrology
02/16/2012
The 22nm node marks the beginning of a major transition from conventional scaling of planar memory devices to complex 3D architectures. SEMATECH au...
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49 semiconductor wafer fabs close 2009-2011
02/15/2012
IC manufacturers closed 49 wafer fabs between 2009 and 2011, according to IC Insights. Smaller wafer fabs (≤200mm) suffered the most closures, and ...
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ISMI convenes 200mm semiconductor fab tool obsolescence forum
02/15/2012
Tool obsolescence is increasingly important to semiconductor manufacturers running 200mm wafer fab lines, reports ISMI, which has chartered an Equi...
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Techcet reveals CMP metrology, supply, and process trends
02/14/2012
Lita Shon-Roy and Michael Fury, PhD, Techcet will present "CMP Market Outlook & New Technology - Dynamic Slurry Metrology," a free we...
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ISSCC round-up: 2.5D packaging for IVRs, smallest NAND flash chip, more
International Solid-State Circuits Conference (ISSCC) is going on now, gathering semiconductor design and device architecture presentations from re...
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MIT's nanowire growth control method could optimize LEDs, other semiconductors
MIT researchers used gases to precisely control nanowires' width and composition as they grow, which could yield complex structures optimally desig...
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Chip substrate factory begins producing thermal-control substrates in Russia
MCLR's factory in Vladimir, Russia, will manufacture substrates and panels for LEDs requiring thermal management, as well as other electronic devic...
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Semiconductor inventory correction occurred, shows Gartner lead time analysis
Semiconductor vendors had slow Q3 and Q4 revenues, indicating that the anticipated correction to chip inventory levels occurred, Gartner reports. T...
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The ultimate limit of Moore’s Law: The one-atom transistor
A team of researchers at the University of New South Wales, Purdue University and the University of Melbourne have built the smallest transistor ev...
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Preventing the Destructive Potential of Partial Discharge on HV Optic Devices
The Partial Discharge phenomenon has been plaguing the electrical and electronic industries for many years, by damaging equipment and increasing production c...
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Cooling Thin Consumer Electronic Devices
Today’s modern electronic devices are more dense and capable than ever before. Cooling these devices is important not only for the reliability and stab...
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FREE WEBCAST: Lens Tilt in Small Auto-Focus CamerasThis webinar will provide an introduction to miniature auto-focus camera technology and voice coil motors. Sponsored by
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