METROLOGY

MAGAZINE

05/03/2012
Volume 55, Issue 4

METROLOGY ARTICLES

North American semiconductor tool makers see higher bookings in April

05/23/2012 North America-based manufacturers of semiconductor fab equipment posted $1.60 billion in orders and $1.45 billion in billings in April 2012 for a b...

SUSS MicroTec takes over SUSS MicroOptics

05/15/2012 SÜSS MicroTec AG has increased its shareholding in SUSS MicroOptics S.A. to 100%. SUSS MicroOptics is a leading company for high-quality refractive...

Advantest DRAM test system clocks 8Gbps test speed on every pin

05/14/2012 Advantest Corporation uncrated the next-generation high-speed DRAM test system, T5511, offering 8Gbps test speed. It can be deployed from R&D t...

UNL taps SEMI-GAS for semiconductor metrology lab’s gas needs

05/08/2012 SEMI-GAS Systems, ultra-high-purity gas source and distribution system maker, will outfit the University of Nebraska - Lincoln’s new Nanoscience Me...

President Obama speaks at Albany Nano-Tech Complex today

05/08/2012 President Barack Obama toured the SUNY - Albany Nano-Tech Complex today, speaking about the economy and education in the CNSE NanoFab Extension Bui...

SEMICONDUCTORS INDUSTRY NEWS

EpiGaN opens GaN-on-Si wafer production at new site

EpiGaN NV opened its GaN epitaxial material production site, on the Research Campus Hasselt in Belgium. EpiGaN’s GaN-on-Si material is used in next...

Direct chip bonding, all-SiC design increase power density in Mitsubishi Electric inverter

Mitsubishi Electric Corporation developed a prototype forced-air-cooled three-phase 400V output inverter with all-silicon carbide (SiC) power modul...

CMP carrier upgrades legacy fab tools

Axus Technology introduced the Titan Carrier Upgrade for IPEC and Strasbaugh legacy CMP chemical mechanical polishing/planarization (CMP) tools for...
Figure. Three new mechanisms at the nanoscale. A computer-model image of an island of metal atoms formed after bombardment by noble gas ions. Atoms disturbed by the bombardment cluster together under the surface and then glide back up in a matter of 2.1ps. SOURCE: Kim Lab/Brown University.

Researchers model ion bombardment for better nanofabrication

Brown University is using supercomputer simulations to better understand the ion bombardment of metal surfaces used in manufacturing nanoelectronics.

Indium expands electronics materials manufacturing with new facility in NY

Indium Corporation acquired a manufacturing facility in Rome, NY, to expand its production capacities of indium-, gallium-, germanium-, and tin-bas...

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