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ST eliminates wafer probes for on-wafer die test

12/14/2011

SEMICON West 2012: Submit an abstract today

12/12/2011

SEMI is looking for presenters for technical sessions and other opportunities at SEMICON West 2012, July 10-12 in San Francisco, CA.

Mentor Graphics integrates T3Ster and FloTHERM for power device thermal management

12/12/2011 Mentor Graphics Corporation (NASDAQ:MENT) has combined technologies for thermal characterization and simulation with T3Ster hardware test products ...

MX's RDL, copper wire bonding processes take aim at packaging costs

12/12/2011 MagnaChip Semiconductor Corporation now offers a redistribution layer (RDL) metal process for wafer bumping and an I/O structure and process that i...

Honeywell taps Tezzaron Semiconductor to stack rad-hard die

12/09/2011 Honeywell Microelectronics will use Tezzaron's 3D stacking on Honeywell’s S150 process on radiation-hardened (rad-hard) aerospace electronics compo...

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