Tohoku University and imec partner to advance research

June 12, 2012 -- In the presence of his Royal highness Prince Philip of Belgium, Tohoku University (Sendai, Japan) and imec signed a collaboration agreement during the Belgian economic mission to Japan. Under the agreement, Tohoku University and imec will work closely together in various common areas of research, learning from each other’s expertise and leveraging each other’s strengths.

The collaboration agreement sets the framework for future collaboration projects between imec and Tohoku University where students, research staff, and professors will be exchanged between both organizations. Moreover, the agreement enables the exchange of samples between imec and Tohoku University, and sets the lines for joint research on specific topics. In the past five years, the 2 partners already collaborated on advanced interconnects, micro electro mechanical systems (MEMS) packaging and low-power sensor circuit readout design. In the future, the collaboration will be expanded to magnetic random access memory (MRAM) process technology, 3D integration technology, biosensors and wireless communication.

Imec aims to set up strategic collaborative relationships with world-class universities that excel in research areas where imec is also conducting studies, and where collaboration is mutually beneficial. The collaboration will also benefit from imec’s state-of-the-art 200 mm and 300 mm cleanroom facilities.

News courtesy of Kelly Chadwick, Optoiq.com.

Font Sizes:

NEW PRODUCTS

Spectra-Physics introduces industrial picosecond laser

May 10, 2013 Spectra-Physics, a Newport Corporation brand, introduces Spirit ps 1040-10, an industrial-grade picosecond laser for precision ...

Multitest announces ecoAmp for high-power applications

May 8, 2013 Multitest announces that its ecoAmp high power Kelvin contactor successfully passed a challenging evaluation for an automotive ...

EV Group rolls out EVG120 processing system

May 7, 2013 EV Group (EVG), a supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology and semiconductor markets, t...

Quartz Imaging introduces automated measurement for semiconductor images

April 30, 2013

It can be very time-consuming for engineers to measure the various features of an X-SEM image of a semiconductor device.


05/01/2013
Volume 56, Issue 3

Article Archive for Small Times Magazine.

SUBSCRIBE

© 2013. PennWell Corporation. All Rights Reserved. PRIVACY POLICY | TERMS AND CONDITIONS