December 30, 2008: FEI Co. introduced a new high-resolution scanning electron microscope at Pittcon 2009.
The new Magellan extreme high-resolution scanning electron microscope (XHR SEM) extends SEM to applications that were previously impossible or impractical, according to a news release from the company. The product allows scientists and engineers to quickly see 3D surface images at many different angles and at resolutions below 1 nanometer, the release said.
Most importantly, it said, the Magellan XHR SEM images sample at very low beam energies, avoiding distortions otherwise caused by the beam penetrating into the material below.
FEI says its new Magellan XHR SEM can see at resolutions below 1nm. (Photo courtesy of FEI Co.)
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