September 10, 2008: Advanced Diamond Technologies (ADT) announces the immediate availability of NaDiaProbes all-diamond atomic force microscopy (AFM) probes, claiming they have 30× the price performance of industry-standard silicon nitride (SiN) probes.
NaDiaProbes are not diamond-coated probes or pieces of diamond mounted on cantilevers. Rather the entire cantilever and tip assembly consists of UNCD, a thin-film form of nanocrystalline diamond, possessing what the company says is "excellent" uniformity and low film stress.
NaDiaProbes are made entirely of UNCD -- both the tip and cantilever -- in a single monolithic structure.
Compared with standard silicon or SiN probes, NaDiaProbes offer >100× less wear rate than silicon nitride probes for imaging hard surfaces, while maintaining a >25nm tip radii; the probe tips also offer low adhesion and surface energy for imaging soft, sticky materials.
"NaDiaProbes showcase our ability to make diamond products using semiconductor manufacturing techniques, and they pave the way for advanced MEMS devices," said John Carlisle, ADT's CTO. "When it comes to an engineering material, it doesn't get any better than diamond."