Ultra-low power processor operates at near-threshold voltage

ultra-low power processorAt this week’s International Solid State Circuits Conference (ISSCC 2013), imec and Holst Centre presented an ultra-low power processor that operates reliably at near-threshold voltages. The processor delivers clock speeds up to 1MHz at voltages down to 0.4 V. In tests based on a Fast Fourier Transform use case, it consumed only 79 µW – a fraction of the power consumption at standard voltages.

“Energy-efficient data processing will be vital for a wide range of emerging applications from Body Area Networks to building automation and equipment monitoring. Reducing active power consumption and standby leakage are thus increasingly important considerations for digital design,” said Harmke de Groot, Program Director at Holst Centre/imec. “Yet much of the industry’s research is still aimed at improving performance rather than increasing battery lifetime by higher energy efficiency.  At Holst Centre, we focus on low power and low voltage to enable battery-powered and energy scavenging smart devices.”

The new energy-efficient processor platform is customized for biomedical applications such as ECG and EEG monitoring. This was realized by creating an interface architecture around a general-purpose processor core to enable ultra-low voltage operation and automatic scaling of performance to improve energy efficiency, plus in-situ monitoring to guarantee reliability and high yield.

One of the key developments was the ability to reduce the operating voltage while delivering enough performance to meet application needs, and maintaining that performance over a range of operating voltages and temperatures. That was achieved by forward biasing the transistors within the processor, allowing it to operate at voltages just above the threshold for the CMOS process used.  The operating voltage can be adjusted between the processor’s nominal voltage of 1.1 V and a minimum voltage of 0.4 V depending on the current performance requirements.

Natural variations in manufacturing processes can lead to voltage fluctuations when a processor is being used. At near-threshold voltages, these fluctuations can be enough to stop the processer working. To avoid this and ensure reliability, the team connected “canary flip-flops” to the most timing-critical parts of the processor. These are designed to fail before the processor’s circuits do and can be monitored – allowing the operating voltage to be scaled up before noise affects the processor. In addition, automatic bias control eliminates the usual voltage drop across the power switches that control the processor, further enhancing energy efficiency and reliability under near-threshold conditions.

To reduce energy consumption even further, the interface can control the state of individual components on the chip separately, for example turning off the processor core or reducing the voltage in the memory when these components are not required. The software interface can also dynamically switch the processor between various performance modes, optimizing the number of active functional units in the core to suit the algorithm being performed. Unused functional units are switched off to reduce power consumption.

Font Sizes:

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.


VIDEOS

Electroiq 2 EIQ2

NEW PRODUCTS

Multitest announces ecoAmp for high-power applications

May 8, 2013 Multitest announces that its ecoAmp high power Kelvin contactor successfully passed a challenging evaluation for an automotive ...

EV Group rolls out EVG120 processing system

May 7, 2013 EV Group (EVG), a supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology and semiconductor markets, t...

Quartz Imaging introduces automated measurement for semiconductor images

April 30, 2013

It can be very time-consuming for engineers to measure the various features of an X-SEM image of a semiconductor device.

Axcelis launches Purion XE high energy implanter

April 30, 2013 Axcelis Technologies, Inc. today announced the introduction of the Purion XE next generation single wafer high energy implanter...

TECHNOLOGY PAPERS

Rapid Defect Indentification with Layout-Aware Diagnosis

Scan logic diagnosis is a powerful tool to help failure analysis engineers determine the root cause of a failing die. Yield engineers, on the other hand, are...

Flip Chip Devices get Flat and Happy

Thin is definitely in, but what our modern flip chip devices really want is to be flat and happy! As flip chip die have become increasingly thinner in recent...

WEBCASTS

Surface Cleaning and Preparation

This introduction requires the development of new critical and selective cleans tackling galvanic corrosion, pattern collapse both in FEOL and BEOL...

450mm Status Report

Hear from the G450C General Manager, Paul Farrar Jr., on the current status of activities, key milestones and schedules, and imec’s senior business...

Join The ConFab discussion

Tue Feb 26 11:27:00 CST 2013

Questions and answers on FD-SOI

Fri Jan 04 14:56:00 CST 2013

Present your ideas at The ConFab in 2013

Mon Nov 26 09:04:00 CST 2012

The ConFab 2013 countdown begins

Thu Aug 09 16:18:00 CDT 2012

The ConFab: Big data is here

Sun Jun 03 19:19:00 CDT 2012

SUBSCRIBE

LATEST ISSUE

05/01/2013
Volume 56, Issue 3

Article Archive for Solid State Technology.

© 2013. PennWell Corporation. All Rights Reserved. PRIVACY POLICY | TERMS AND CONDITIONS