2013: The year of the diamond?

By Mario M. Pelella, VP of Engineering, sp3 Diamond Technologies

Interest in diamond continues to grow within traditional thermal and wear applications (packaging, tool coating) and beyond into new applications (semiconductor, MEMS/NEMS, optical, interposers, electrodes, sensors, wastewater treatment, acoustic) that were previously difficult to exploit.

Diamond’s unique physical and electrical properties, which include the highest known thermal conductivity, highest Young’s modulus (diamond is the hardest substance man has ever discovered), a wide band gap, excellent electrical insulator properties, very low thermal expansion, very high breakdown voltage, very high carrier mobility, high radiation hardness, chemical and biochemical inertness and the broadest electromagnetic transmission spectrum, makes this remarkable technology a key enabler to break through current limitations and extend the performance and scalability of existing products well into the future.

For the currently available diamond-deposition systems, hot-filament chemical vapor deposition (HFCVD) growth technology provides the most reliable, safest and most cost effective solution that enables high throughput and good uniformity, control, repeatability and ease of scaling over large areas. Although current deposition areas are in the 350 mm x 375 mm range, scaling the HFCVD technology deposition area to 1000mm x 1000mm is viable, unlike other diamond-growth technologies.

The next step in the evolution of the semiconductor industry is to establish an SOD (silicon-on-diamond) substrate platform that mitigates the thermal impact of ever increasing power densities and suppresses local hot spots that influence peak performance and reliability (FIT rates) specifications, especially for RF power circuits and 3D-ICs. Moreover, incorporating diamond solutions into the MtM (more-than-Moore) technology roadmap will help extend electronic device and sensor performance metrics for a broad array of applications. All the process integration pieces to fully embrace SOD technology have been demonstrated, although productizing a 200mm (or larger) SOD substrate platform for high volume is still an elusive goal for the industry. Government agencies and corporate research and development funding continue to champion the maturity and advancement of diamond technology, which will help shorten the commercialization cycle of this exceptional material.

Recent advances in diamond applications (diamond-on-silicon, MEMS, optical), including record folded-beam RF resonator performance with a Q value of 146,580 at 232.4 kHz, IR transmission values nearing the theoretical limit of 71 percent, brighter, more energy-efficient LED lamps, exceptional figure-of-merit for RF power devices that are 40-50 times better than Si substrates, and demonstrated diamond-based diodes, BJTs, FETs, SAW filters, and field-emission devices, suggest that its utilization into a broader scope of commercial products is not far away.

Font Sizes:

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.


VIDEOS

Electroiq 2 EIQ2

NEW PRODUCTS

EV Group rolls out EVG120 processing system

May 7, 2013 EV Group (EVG), a supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology and semiconductor markets, t...

Quartz Imaging introduces automated measurement for semiconductor images

April 30, 2013

It can be very time-consuming for engineers to measure the various features of an X-SEM image of a semiconductor device.

Axcelis launches Purion XE high energy implanter

April 30, 2013 Axcelis Technologies, Inc. today announced the introduction of the Purion XE next generation single wafer high energy implanter...

EMS debuts low-cost conductive LED die attach adhesive

April 29, 2013 Engineered Material Systems debuted its CA-105 Low-Cost Conductive LED Die Attach Adhesive for attaching LEDs and other small s...

TECHNOLOGY PAPERS

Rapid Defect Indentification with Layout-Aware Diagnosis

Scan logic diagnosis is a powerful tool to help failure analysis engineers determine the root cause of a failing die. Yield engineers, on the other hand, are...

Flip Chip Devices get Flat and Happy

Thin is definitely in, but what our modern flip chip devices really want is to be flat and happy! As flip chip die have become increasingly thinner in recent...

WEBCASTS

Surface Cleaning and Preparation

This introduction requires the development of new critical and selective cleans tackling galvanic corrosion, pattern collapse both in FEOL and BEOL...

450mm Status Report

Hear from the G450C General Manager, Paul Farrar Jr., on the current status of activities, key milestones and schedules, and imec’s senior business...

SUBSCRIBE

LATEST ISSUE

05/01/2013
Volume 56, Issue 3

Article Archive for Solid State Technology.

© 2013. PennWell Corporation. All Rights Reserved. PRIVACY POLICY | TERMS AND CONDITIONS