Researchers install AIXTRON MOCVD for GaN-on-Si power device R&D

08/14/2012

August 14, 2012 -- National Central University (NCU) in Taiwan will use an AIXTRON metal-organic chemical vapor deposition (MOCVD) system to research gallium-nitride-on-silicon (GaN-on-Si) power semiconductors.

An existing AIXTRON customer, NCU installed a 1 x 6” AIXTRON Close Coupled Showerhead MOCVD system. They will grow GaN epitaxial structures on 6” silicon substrates, which will be used in R&D of power management devices.

AIXTRON’s local support team installed and commissioned the new reactor in the state-of-the-art cleanroom facility at NCU’s Microwave and Optoelectronic Devices Laboratory.

“Demand for low-cost GaN-based power devices in high-efficiency and high-power systems continues to increase. To satisfy this need, we therefore plan to transfer our specially developed semiconductor materials technology to industry, for a pilot initially, and then for large-scale production,” said Professor Jen-Inn Chyi, Chair Professor of Electrical Engineering at the National Central University of Taiwan. The team selected the AIXTRON multi-wafer MOCVD system for the hetero-epitaxial growth of GaN structures on large area silicon wafers to develop high-performance devices as cost-efficiently as possible.

The National Central University (NCU) of Taiwan offers research and academic excellence with cooperative education programs and research projects, cutting-edge research and innovative learning. NCU research programs are wide ranging and include complex systems, liquid-crystals, neural networks, phonon and photon lattices, semiconductors, magnetic thin-films and superconductivity.

AIXTRON provides MOCVD production technologies for semiconductor devices, such as LEDs, lasers, transistors and solar cells. For further information on AIXTRON (FSE: AIXA, ISIN DE000A0WMPJ6, DE000A1MMEF7; NASDAQ: AIXG, ISIN US0096061041), see www.aixtron.com.

Visit the Semiconductors Channel of Solid State Technology!

Font Sizes:

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. 


VIDEOS

Electroiq 2 EIQ2

TECHNOLOGY PAPERS

Automated Test Creation for Mixed Signal IP using IJTAG

The creation of test patterns for mixed signal IP has been, to a large extent, a manual effort. To improve the process used to test, access, and control embe...

Faster Time to Root Cause with Diagnosis-Driven Yield Analysis

This whitepaper describes the benefits of implementing a diagnosis-driven yield analysis flow using the Tessent® Diagnosis and Tessent YieldInsight® software...

WEBCASTS

Innovation in Semiconductor Manufacturing Instrumentation

As the industry is incorporating more MEMS devices with integrated magnetic sensors, they are encountering challenges that cannot be overcome with ...

3D and 2.5D Integration: A Status Report Live Event

This webcast will explore the present status of 2.5 and 3D integration, including TSV formation.

Questions and answers on FD-SOI

Fri Jan 04 14:56:00 CST 2013

Present your ideas at The ConFab in 2013

Mon Nov 26 09:04:00 CST 2012

The ConFab 2013 countdown begins

Thu Aug 09 16:18:00 CDT 2012

The ConFab: Big data is here

Sun Jun 03 19:19:00 CDT 2012

Oh, snap!: Pics from The ConFab

Sun Jun 03 19:09:00 CDT 2012

SUBSCRIBE

LATEST ISSUE

Volume 56, Issue 1

Article Archive for Solid State Technology.

© 2013. PennWell Corporation. All Rights Reserved. PRIVACY POLICY | TERMS AND CONDITIONS