CNTs produced with >95% semiconducting content now available from SWeNT

05/31/2012

May 31, 2012 -- SouthWest NanoTechnologies (SWeNT) released SG65i, a single-wall carbon nanotube (SWCNT) product with >95% semiconducting concentration, before secondary processing to remove metallic SWCNT content.

SG65i, building on SWeNT’s grade SG65, was developed for use in printed semiconductor devices, such as thin-film transistors (TFT) in organic light-emitting diode (OLED) displays, next-generation non-silicon semiconductor computing devices, and more.

SG65i is produced via the proprietary CoMoCAT process, which controls SWCNT structure, or chirality. Single-wall carbon nanotubes can be metallic or semiconducting, depending on diameter and chirality.

The >95% semiconducting content is approximately 28% more than most other SWCNTs, SWeNT reports. This high concentration avoids much slow, expensive, low-yielding secondary processing for semiconductor applications. Secondary processing to remove metallic SWCNTs can damage the remaining SWCNTs, SWeNT notes.

SG65i is available either as dry powder, aqueous or solvent based dispersions, or as printable ink.

SWeNT will continue improving processes to synthesize even more semiconductor-enriched products, with the goal of eliminating secondary processes altogether.

SouthWest NanoTechnologies (SWeNT) is an advanced materials company that manufactures high-quality single-wall and specialty multi-wall carbon nanotubes (SWCNT, MWCNT) products in various forms, including powders, pastes, dispersions and inks. For more information, please visit www.swentnano.com.

Visit our new Displays Manufacturing Channel on Solid State Technology and subscribe to our Displays Digest e-newsletter!

Font Sizes:

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. 


VIDEOS

Electroiq 2 EIQ2

TECHNOLOGY PAPERS

Automated Test Creation for Mixed Signal IP using IJTAG

The creation of test patterns for mixed signal IP has been, to a large extent, a manual effort. To improve the process used to test, access, and control embe...

Faster Time to Root Cause with Diagnosis-Driven Yield Analysis

This whitepaper describes the benefits of implementing a diagnosis-driven yield analysis flow using the Tessent® Diagnosis and Tessent YieldInsight® software...

WEBCASTS

Innovation in Semiconductor Manufacturing Instrumentation

As the industry is incorporating more MEMS devices with integrated magnetic sensors, they are encountering challenges that cannot be overcome with ...

3D and 2.5D Integration: A Status Report Live Event

This webcast will explore the present status of 2.5 and 3D integration, including TSV formation.

SUBSCRIBE

LATEST ISSUE

Volume 56, Issue 1

Article Archive for Solid State Technology.

© 2013. PennWell Corporation. All Rights Reserved. PRIVACY POLICY | TERMS AND CONDITIONS