(September 29, 2010 - BUSINESS WIRE) -- Keithley Instruments Inc. (NYSE:KEI), advanced electrical test instrumentation and systems provider, updated its ACS Basic Edition Semiconductor Parametric Test Software for semiconductor test and measurement applications. ACS Basic Edition Version 1.2 adds new levels of usability, convenience, and productivity in the characterization of component or discrete (packaged) semiconductor devices.
It features a Trace Mode that allows an instantaneous check of results and interactively controls voltage sweeps to avoid impending device breakdown. The new Trace Mode feature of ACS Basic Edition Version 1.2 supports interactive testing of a device. It can be used to map out the operating range and characteristics of a DUT while avoiding damage to the device. This interactive mode includes a convenient method of controlling the voltage level of a sweep with either a virtual slide bar or the arrow keys on a PC keyboard.
In addition to full support for Keithley's source-measure (SMU) instrumentation, ACS Basic Edition combines high speed hardware control, device connectivity, and data management for part verification, debugging, and analysis.
ACS Basic Edition offers a set of quick and easy-to-access test libraries, so no programming is needed. An intuitive GUI further simplifies many types of I-V testing, data collection, and analysis. Even novice users can test a semiconductor component in seconds, generate a family of curves, and then compare them with reference curves immediately. While pre-configured tests minimize startup time, the user still has the flexibility to optimize a test or the entire test system.
It can be used for packaged part characterization in applications from early device research through development, quality verification, and failure analysis. It also can be used in university research and device development, aiding in the transition from pure research to commercial application. It can also be used in semiconductor facilities and companies involved in pilot production for process refinement at the component level, supporting engineers involved in QA, failure analysis, and post-production testing.
For more information, visit www.keithley.com/products/semiconductor/characterizationsoftware/acsbasic/?mn=ACSBasicEdition.
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