Initiative to develop interconnect models for standardized 130-nm process technology

11/27/2000

Santa Clara, California--Sequence Design Inc. is collaborating with the Semiconductor Technology Academic Research Center of Japan (STARC) to produce highly accurate interconnect models for a standardized 130-nanometer (0.13-micron) silicon process.

STARC is an organization funded by Japan's leading semiconductor manufacturers with the goal of strengthening the country's technological foundation in silicon semiconductors as well as enhancing international competitiveness. STARC member companies include Fujitsu, Hitachi, Matsushita, Mitsubishi, NEC, OKI, Rohm, Sanyo, Sharp, Sony, and Toshiba.

The aim of the STARC project is to create a common 130-nm design rule specification for use by third party library and IP vendors in the creation of a single set of libraries or IP blocks that customers may use no matter which member foundry is targeted. This common design rule specification also will enable the major Japanese foundries to build standardized IP to share.

"As process technology advances, achieving the most accurate interconnect models is essential to being able to predict parasitic effects on timing of real silicon," says Koichi Fujita, general manager of Advanced CMOS Technology at Fujitsu Limited and member of STARC. "I am confident that our efforts with STARC will help to identify the key technologies we need to be successful at 130-nm and beyond and benefit our customers greatly."

"STARC and its member companies continues to work with leading edge companies like Sequence Design to implement 'best-in-class' technologies such as Columbus because of its highly accurate interconnect modeling capabilities," explains Tom Nukiyama, executive technical director of NEC Electronics, Inc. and member of STARC. "Sequence's interconnect modeling technology has shown impressive capabilities and we are confident that its use will ensure generation of highly accurate interconnect models for this advance in 130-nm silicon process technology and beyond."

"We are very pleased by STARC's recognition of our Columbus technology. It is yet another validation of the importance of accurate interconnect modeling for 180-nm and beyond," says Vic Kulkarni, chief operating officer for Sequence. "In working with some of the world's leading traditional and pure foundries on the latest silicon technologies, detailed modeling capabilities are essential to maintain accuracy. Columbus is the most accurate interconnect modeling tool for today's advanced processes--which is essential in order to predict real timing performance in silicon."

Font Sizes:

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. 


VIDEOS

Electroiq 2 EIQ2

TECHNOLOGY PAPERS

Automated Test Creation for Mixed Signal IP using IJTAG

The creation of test patterns for mixed signal IP has been, to a large extent, a manual effort. To improve the process used to test, access, and control embe...

Faster Time to Root Cause with Diagnosis-Driven Yield Analysis

This whitepaper describes the benefits of implementing a diagnosis-driven yield analysis flow using the Tessent® Diagnosis and Tessent YieldInsight® software...

WEBCASTS

Innovation in Semiconductor Manufacturing Instrumentation

As the industry is incorporating more MEMS devices with integrated magnetic sensors, they are encountering challenges that cannot be overcome with ...

3D and 2.5D Integration: A Status Report Live Event

This webcast will explore the present status of 2.5 and 3D integration, including TSV formation.

Questions and answers on FD-SOI

Fri Jan 04 14:56:00 CST 2013

Present your ideas at The ConFab in 2013

Mon Nov 26 09:04:00 CST 2012

The ConFab 2013 countdown begins

Thu Aug 09 16:18:00 CDT 2012

The ConFab: Big data is here

Sun Jun 03 19:19:00 CDT 2012

Oh, snap!: Pics from The ConFab

Sun Jun 03 19:09:00 CDT 2012

SUBSCRIBE

LATEST ISSUE

Volume 56, Issue 1

Article Archive for Solid State Technology.

© 2013. PennWell Corporation. All Rights Reserved. PRIVACY POLICY | TERMS AND CONDITIONS