July 27, 2012 - Marketwire -- Cascade Microtech Inc. (NASDAQ:CSCD), supplier of wafer-level measurement instruments for ICs, held its first Innovation Awards Ceremony to honor inventors, authors and other innovators at the company.
Cascade Microtech promoted its history in the test and measurement industry -- the first microwave on-wafer probe, the first GHzF- capable probe card, the first on-wafer power device characterization system, the first integrated 1/f noise measurement system, the first multi-channel configurable quadrant probe capable of automated testing over temperature, and the first production power test system -- with honors for “an elite group” of creative and innovative employees, said Steve Harris, EVP, Cascade Microtech.
Cascade Microtech will tout the achievements of 42 inventors and authors in the US and 32 inventors and authors in Europe, Asia and Japan.
The company also this week announced Debbora Ahlgren as VP of marketing, joining the company from The CBA Group, comprised of Universal Instruments Corporation and Hover-Davis, and with experience at OptimalTest Inc., Verigy, Agilent Technologies, KLA-Tencor, and Schlumberger.
Cascade Microtech, Inc. (NASDAQ:CSCD) is a worldwide leader in precision contact, electrical measurement and test of integrated circuits (ICs), optical devices and other small structures. For more information, visit www.cascademicrotech.com.
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