June 7, 2012 -- FormFactor Inc. (NASDAQ: FORM) introduced TrueScale Matrix probe cards for 200mm and 300mm Full Wafer Contact system-on-chip (SoC) test applications. TrueScale Matrix applies FormFactor’s high-parallel capabilities from SmartMatrix and TouchMatrix memory product solutions to SoC test.
The Matrix architecture provides consistent contact performance across the full wafer, over the life of the probe card. The TrueScale Matrix platform leverages the company's MicroSpring 3D micro electro mechanical system (MEMS) contact technology to increase wafer test cell utilization and parallelism and improve test yields.
The TrueScale Matrix solution enables manufacturers of embedded memory and automotive applications to reduce the number of touchdowns per wafer, while achieving stable test over a wide temperature range. New high-parallel SoC test systems can leverage the TrueScale Matrix architecture for DUT array optimization to achieve 256 DUTs in parallel capability today, with extendibility to 512 DUTs or higher.
The most recent TrueScale Matrix product shipment was made to a leading automotive device supplier for highly parallel microcontroller test. FormFactor's customers have installed over 1200 units of the Matrix probe solutions.
FormFactor, Inc. (NASDAQ:FORM) makes advanced wafer probe cards, which are used by semiconductor manufacturers to electrically test ICs. For more information, visit the company's web site at www.formfactor.com.