June 5, 2012 - GLOBE NEWSWIRE -- Semiconductor test and burn-in equipment maker Aehr Test Systems (Nasdaq:AEHR) will install an additional FOX-1 full-wafer test system at a leading flash memory manufacturer. The follow-on order is an “endorsement of the ongoing cost saving benefits” that can be achieved with Aehr full-wafer test, said Carl Buck, VP of marketing at Aehr Test Systems.
The FOX-1 tester uses Aehr’s WaferPak contactor to perform parallel testing of thousands of die on a 300mm wafer with one touchdown. It is used for test and/or short test during burn-in applications.
Aehr expects that its installed base of systems is reaching capacity levels, leading to follow-on orders for new systems, Buck said.
Other members of Aehr Test's FOX family of products are focused on long-duration full wafer burn-in and test of products such as automotive ICs, DRAMs and VCSELs (laser diodes). Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic and memory integrated circuits. For more information, visit www.aehr.com.
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