(March 13, 2006) Munich, Germany — SUSS MicroTec and Instrument Systems have formed a strategic partnership to develop a next-generation, high-throughput test system for LED devices at wafer-level that tests up to 70,000 LED dies per hour.
Intel’s 22-nm Trigate Transistors Exposed
Lester the Lightbulb vs CFL and LED: The Saga Continues
Intel's (INTC) 2011 earnings, Q1 outlook, and executive reshuffle
Early 450mm orders: Tire-kicking or seat-warming?
IFTLE: MEPTEC 2.5, 3D and beyond
IEDM 2011: IBM displays via-middle TSV process for die stacking
| Materials |
Print
Email
Save
