(February 17, 2005) Fremont, Calif. — Aehr Test Systems announces it has received the first order for its next-generation MAX test during burn-in system from a major semiconductor manufacturer. The system is scheduled to ship in the second half of calendar 2005 to a manufacturer of communications ICs.
"This new system has been designed to be highly configurable to meet a wide variety of customer's needs," says Carl Buck, VP of marketing for Aehr Test Systems. "It can perform monitored burn-in on over 12,000 low-power devices. For manufacturers who see the power requirements of their devices increasing to a level that they now need individual device temperature control, the new system is also a cost-effective solution for providing this capability for up to 50 W per device."
"The new system builds upon the highly successful architecture of previous MAX systems," says Bill Barraclough, product marketing manager. "Since this system is fully compatible with previous-generation MAX systems, existing users can benefit from adding production capacity for their existing products, and also add significant new capabilities for their future needs. The new system allows both new and existing customers to easily bridge the gap between traditional, low-power burn-in systems and higher-power systems with individual device temperature control."
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